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Fernanda LIMA KASTENSMIDT,

Theme: Using Programmable SoC for Reliable Applications: Qualification Methodologies, Fault Tolerance Techniques and Radiation Tests
Date: 09/05/2018 - 10:00, TIMA Laboratory - Room T312

Biography

Fernanda LIMA KASTENSMIDT joined the Instituto de Informática faculty in 2005. She received a PhD in 2003 and MSE in 1999 both in Computer Science from Universidade Federal do Rio Grande do Sul (UFRGS) in Porto Alegre, RS, Brazil. She has done internship at Xilinx, USA and in INPG, France, during her PhD. Dr. Fernanda’s current research focuses on soft error mitigation techniques for SRAM-based FPGAs and integrated circuits, such as microprocessors, memories and network-on-chips (NoCs), and the analysis and modeling of radiation effects in those circuits. She currently advises MSE and PhD thesis at the Computer Science Graduation Program (PPGC) http://ppgc.inf.ufrgs.br/ and at the Microelectronics Program (PGMICRO) http://www.inf.ufrgs.br/pgmicro/. She has published the book Fault-Tolerance Techniques for SRAM-based FPGAs and more that 50 papers in scientific journals. She has worked in the payload of the cubesat NanoSat-BR1 and in the new NanoSat-BR2.

Abstract

All Programmable System-on-Chip (APSoC) devices can offer high performance because of the combination between high speed embedded processors and the flexibility of the programmable logic. Thus, APSoC can be attractive for self-driving car, satellites, servers, CERN environment and many other applications that require reliability. However, APSoCs may be prone to experience Single Event Effects (SEE). In this tutorial, I will present a methodology to characterize the Processing System (PS) and the Programmable Logic (PL) under soft errors. Then, I will present a set of fault tolerance techniques that can be applied in the PS and in the PL parts for increasing the reliability. Furthermore, I will present radiation tests results for many applications running in a APSOC from Xilinx: Zynq.