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Gildas LEGER, University of Seville

Theme: Why is systematic AMS-RF test not there yet ?
Date: 30/11/2017 - 14:00, Laboratoire TIMA - Salle T312


Gildas LEGER received the Physics engineering degree from the Institut National des Sciences Appliquées (INSA) of Rennes, France, in 1999 and the Ph.D. degree in microelectronics from the University of Seville, Spain, in 2007. Since 2008 he holds a position of Tenured Scientist for the Spanish National Science Council (CSIC) at the Microelectronics Institute of Seville (IMSE-CNM). His main research interests are focused on both Design and Test of AMS-RF circuits, with a particular emphasis on Space applications and Data Converters. He has repeatedly served as a member of the Program Committee for several important conferences in the field of test, like DATE or ETS.


Testing analog, mixed-signal and RF (AMS-RF) circuits represents a significant cost component for testing complex SoCs. Moreover, AMS-RF test generation and validation are still largely handcrafted tasks that rely on expert design knowledge for each particular Device Under Test (DUT). Mixed-signal test automation has been sought by the test community for the last decades, trying to mimic the success of digital test approaches. Indeed, in the digital domain, test is vastly automated and standard techniques are already available (ATPGs, BIST, scan registers, etc.). In the last decade, a methodology based on leveraging the power of machine learning algorithms has been proposed for AMS-RF circuits that opens the door to a higher level of automation. In this presentation we review recent results in this line and try to put together what could be such a complete methodology and what remains to be done.