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Prof. J. Altet, Universitat Polytècnica de Catalunya, Spain

Theme: Temperature measurements to perform test and characterization of RF circuits: A built-in approach
Date: Wednesday May 9th 2012, 14h00, Latoratoire TIMA, room T 312


Josep Altet is an Associate Professor at the Electronic Engineering Department Universitat Politècnica de Catalunya, Barcelona, Spain. He was a visiting researcher at the University of British Columbia, Canada, in 2001 working in the field of test of analog circuits. He was an invited maitre de conférence at Université Bordeaux I, France, in 2002 and 2003, working in the field of thermal coupling modeling and characterization in ICs. He was a visiting researcher at the Centro Nacional de Microelectrónica, Spain, in 2008 and at Texas A&M University, USA, in 2009. His research interests are in the areas of thermal coupling modelling and characterization, temperature sensor design, and use of temperature as test observable for integrated circuits.


Nowadays, test and characterization of RF circuits is a challenging task, due to the costs and technical challenges that it implies.In this presentation I would like to present some results of the research we have been doing during the last years: how we can extract information about the performances of high frequency circuits by measuring the temperature at the silicon surface while the RF circuit is working…. like when you go to a doctor: with a thermometer to know what are the wrong characteristics of a RF circuits. I focus the presentation on experimental results, with ICs that we have designed and that contain RF circuits and embedded temperature sensors.