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IEEE International Test Conference (ITC'2018) (ITC)

Date : October 28 - November 2, 2018
Lieu : Phoenix (Arizona), USA

program committee : ANGHEL L., VATAJELU E.I.


Résumé : It is our privilege to welcome you to the 49th International Test Conference (ITC) sponsored by IEEE and the IEEE Philadelphia Section. ITC is the world’s premier conference dedicated to electronics test. Our volunteer committees worked very hard to provide to you an exciting event with a balance of the latest research, practical applications, and networking opportunities. This year we are co-locating with ISTFA conference the week of October 28, 2018.

Our topics include emerging test needs for artificial intelligence, automotive and IoT, hardware security, system test, analog and mixed-signal test, yield learning, test analytics, test methodology, benchmarks, test standards, memory and 3D test, diagnosis, DFT architectures, functional and software-based test.

In addition to the usual best paper award, we have selected the top papers based on reviewers’ scores to be Distinguished Papers. These outstanding papers will be identified in the program.

ITC is expanding its presence! We had great success with our 2017 initial sister conferences, ITC-Asia and ITC-India in Taiwan and Bangalore, respectively.

The conference is organized in a way to provide you various methods to learn and discuss topics related to electronics test. Our keynote speakers are well known industry leaders and academic researchers that provide exciting insights. The technical papers are 20 minute presentations of papers that were selected from a rigorous review process with a few minutes for questions at the end of each paper. The exhibition floor consists of solutions providers who are available for discussion and learning about their offerings. A corporate forum is held on the exhibit floor where exhibiting companies present about their products. This year we plan to have one poster session held on the exhibition floor. Posters provide a very comfortable and informal environment to discuss details with the authors.

We recognize that networking is extremely valuable to our attendees. Multiple breaks and social events are integrated in the program to allow you to network with colleagues and other specialists. Free lunches are provided in the exhibit hall for full- and one-day ITC conference attendees.

On behalf of the 2018 International Test Conference steering committee, program committee and all the dedicated volunteers who are key to making the program complete, we welcome you to this year’s exciting technical program and exhibits.

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