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108 résultats

  11 Revues internationales
   1 Brevets
  15 Conférences invitées
  52 Conférences internationales
   3 Chapitres de livre
   1 Revues nationales
   7 Autres communications
   5 Logiciels
  13 Thèses

11 Revues internationales

 1 Leveugle R., Mkhinini A., Maistri P., Hardware Support for Security in the Internet of Things: From Lightweight Countermeasures to Accelerated Homomorphic Encryption, Information - Open Access Journal of Information Science, Ed. MDPI, Vol. , DOI: 10.3390/info9050114, mai 2018
 
 2 Mkhinini A., Maistri P., Leveugle R., Tourki R., Co-designed accelerator for homomorphic encryption applications, Advances in Science, Technology and Engineering Systems Journal (ASTESJ), Vol. 3, No. 1, pp. 426-433, DOI: 10.25046/aj030152, février 2018
 
 3 Vatajelu I., Prinetto P., Taouil M., Hamdioui S., Challenges and Solutions in Emerging Memory Testing, IEEE Transactions on Emerging Topics in Computing, Ed. IEEE, Vol. PP, No. 99, DOI: 10.1109/TETC.2017.2691263, 2017
 
 4 Alexandrescu D., Altun M., Anghel L., Ciriani V., Tahoori M., Bernasconi A., Logic synthesis and testing techniques for switching nano-crossbar arrays, Microprocessors and Microsystems, Ed. Elsevier, Vol. 54, pp. 14-25, DOI: 10.1016/j.micpro.2017.08.004, octobre 2017
 
 5 Javaheri N., Morin-Allory K., Borrione D., Synthesis of Regular Expressions Revisited: from PSL SEREs to Hardware, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Ed. IEEE, Vol. 36, No. 5, pp. 869-882, DOI: 10.1109/TCAD.2016.2600241 , mai 2017
 
 6 Deng E., Prenat G., Anghel L., Non-Volatile Magnetic Decider Based on Magnetic Tunnel Junctions, Electronics Letters, Ed. IEEE, Vol. , 2016
 
 7 Pontié S., Maistri P., Leveugle R., Dummy operations in scalar multiplication over elliptic curves: a tradeoff between security and performance, Microprocessors and Microsystems, Ed. Elsevier, Vol. 47, No. Part A, pp. 23-36, DOI: 10.1016/j.micpro.2016.02.016, novembre 2016
 
 8 Papadimitriou A., Hély D., Beroulle V., Maistri P., Leveugle R., Analysis of laser-induced errors: RTL fault models versus layout locality characteristics, Microprocessors and Microsystems, Ed. Elsevier, Vol. 47, No. Part A, pp. 64-73, DOI: 10.1016/j.micpro.2016.01.018, novembre 2016
 
 9 Pierre L., Auxiliary Variables in Temporal Specifications: Semantic and Practical Analysis for System-Level Requirements, Transactions on Design Automation of Electronic Systems (TODAES), Ed. ACM, NY, USA, Vol. 21, No. 2, pp. Article n°20, DOI: 10.1145/2811260, janvier 2016
 
10 Morin-Allory K., Javaheri N., Borrione D., Efficient and Correct by Construction Assertion-Based Synthesis, Transactions on Very Large Scale Integration (VLSI) Systems, Ed. IEEE, Vol. 23, No. 12, pp. 2890-290, DOI: 10.1109/TVLSI.2014.2386212, décembre 2015
 
11 Ottavi M., Pontarelli S., Gizopoulos D., Bolchini C., Michael M.K., Anghel L., Tahoori M., Paschalis A., Reviriego P., Bringmann O., Izosimov V., Manhaeve H., Strydis C., Hamdioui S., Dependable Multicore Architectures at Nanoscale: The View From Europe , IEEE Design & Test, Ed. IEEE, Vol. 32, No. 2, pp. 17-28, DOI: 10.1109/MDAT.2014.2359572, avril 2015
 
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1 Brevets

1 Portolan M., Test apparatus and method for testing an integrated circuit, No. 17/54491, 19 mai 2017
 
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15 Conférences invitées

 1 Di Natale G., Kooli M., Bosio A., Portolan M., Leveugle R., Reliability of computing systems: from flip flops to variables, Invited talk (Special Session), 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, GREECE, DOI: 10.1109/IOLTS.2017.8046242, 3 au 5 juillet 2017
 
 2 Anghel L., Benabdenbi M., Bosio A., Vatajelu I., Test and reliability in approximate computing, Invited paper, Mixed Signals Testing Workshop (IMSTW 2017), Thessaloniki, GREECE, DOI: 10.1109/IMS3TW.2017.7995210, 3 au 5 juillet 2017
 
 3 Leveugle R., New approaches towards early dependability evaluation of digital integrated systems, Invited Tutorial, 11th IEEE International Design & Test Symposium (IDT'16), Hammamet, TUNISIA, 18 au 20 décembre 2016
 
 4 Maistri P., Hardware Design of Error Detection Schemes for Symmetric Ciphers, Séminaire invité, Séminaire sécurité des systèmes électroniques embarqués, Rennes, FRANCE, 2 décembre 2016
 
 5 Maistri P., Countermeasures against Implementation Attacks on Private- and Public-Key Cryptosystems, Keynote in the Opening Session, International Conference on Applications and Techniques in Information Security, Cairns, AUSTRALIA, 26 au 28 octobre 2016
 
 6 Anghel L., Portolan M., Managing Wear out and Variability Monitors: IEEE 1687 to the Rescue, Keynote talk, East West Design and test Symposium, Yerevan, ARMENIA, 13 au 16 octobre 2016
 
 7 Leveugle R., DFT vs. Security - Is it a Contradiction? How Can We Get the Best of Both Worlds?, Invited Talk, 1st IEEE International Verification and Security Workshop, St Feliu de Guixols, SPAIN, 4 au 6 juillet 2016
 
 8 Pontié S., Prise en compte des fuites d’informations par canaux auxiliaires dans une implémentation ECC, Invited Talk, Séminaire sécurité des systèmes électroniques embarqués, Rennes, FRANCE, 27 juin 2016
 
 9 Portolan M., System Level Coordination of Multiple-Standard DfT, Invited Talk, Test Standards Application Workshop (TESTA’16), Amsterdam, NETHERLANDS, 28 mai 2016
 
10 Anghel L., System Failure Prediction with On-Chip Monitors, Plenary talk, Colloque National 2016 de GDR SOC-SIP, Nantes, FRANCE, 7 au 8 mai 2016
 
11 Portolan M., Standards: Can they co-exist for System Level Test?, Invited Talk, VLSI Test Symposium, Las Vegas, NE, UNITED STATES, 25 au 27 avril 2016
 
12 Borrione D., Automatic Synthesis of Verification IP's from Assertions: Beyond Observers, 19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS'16), Košice, SLOVENIA, 20 au 22 avril 2016
 
13 Anghel L., Moniteurs de fiabilité embarqués en technologie FDSOI: Implémentation et Applications, Invited Talk, Ecole d'hiver Francophone sur les Technologies de Conception des Systèmes Embarqués Hétérogènes (FETCH'16), Vilard de Lans, FRANCE, 4 au 7 janvier 2016
 
14 Borrione D., Morin-Allory K., Liu M., Oddos Y., Morin-Allory K., Javaheri N., Verification and Synthesis of Digital Systems from Assertions, Ecole d'hiver Francophone sur les Technologies de Conception des Systèmes embarqués Hétérogènes (FETCH'16), Villards de Lans, FRANCE, 1 janvier 2016
 
15 Anghel L., Reliability Measurements with In Situ Aging Monitors in FDSOI Technology, Invited talk (Elevator talk), International Test Conference (ITC'15), Anaheim, UNITED STATES, 6 au 8 octobre 2015
 
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52 Conférences internationales

 1 Dutertre J.M., Beroulle V., Candelier P., De Castro S., Faber L.-B., Flottes M.-L., Gendrier P., Hély D., Leveugle R., Maistri P., Di Natale G., Papadimitriou A., Rouzeyre B., Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model, Fourteenth Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC'2018), Amsterdam, NETHERLANDS, 13 septembre 2018
 
 2 Morgül Muhammed Ceylan, Frontini L., Vatajelu I., Anghel L., Integrated Synthesis Methodology for Crossbar Arrays, IEEE NANOARCH'2018, Athens, GREECE, 18 au 19 juillet 2018
 
 3 Vatajelu I., Anghel L., Portal J.-M., Bocquet M., Prenat G., Resistive and Spintronic RAMs: Device, Simulation, and Applications, IEEE International On Line Testing (IOLTS'2018), Platja d'Aro, SPAIN, 2 au 4 juillet 2018
 
 4 Dutertre J.M., Beroulle V., Candelier P., De Castro S., Faber L.-B., Flottes M.-L., Gendrier P., Hély D., Leveugle R., Maistri P., Di Natale G., Papadimitriou A., Rouzeyre B., The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks, 24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS'2018), Platja d'Aro, SPAIN, 2 au 4 juillet 2018
 
 5 Sivadasan A., Shah R., Cacho F., Anghel L., NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI, Design Automation and Test in Europe (DATE'2018), Dresden, GERMANY, 19 au 23 mars 2018
 
 6 Shah R., Cacho F., Anghel L., Investigation of speed sensors accuracy for process and aging compensation, IEEE International reliability Physics Symposium (IRPS'2018), San Francisco, UNITED STATES, 11 au 15 mars 2018
 
 7 Plassan G., Morin-Allory K., Borrione D., Extraction of missing formal assumptions in under-constrained designs, 15th ACM-IEEE International Conference on Formal Methods and Models for System Design (MEMOCODE 2017), pp. 94-103, Vienna, AUSTRIA, DOI: 10.1145/3127041.3127046, 29 septembre au 2 octobre 2017
 
 8 Pierre L., Chabot M., Assertion-Based Verification for SoC Models and Identification of Key Events, Euromicro Conference on Digital System Design (DSD 2017), Vienna, AUSTRIA, 30 août au 1 septembre 2017
 
 9 Vatajelu I., Anghel L., Fully-Connected Single-Layer STT-MTJ-based Spiking Neural Network under Process Variability, ACM/IEEE International Symposium on Nanoscale Architectures (NANOARCH 2017), Newport, RI, UNITED STATES, 25 au 29 juillet 2017
 
10 Cacho F., Benhassain A., Shah R., Huard V., Anghel L., Investigation of critical path selection for in-situ monitors insertion, 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), pp. 247-252, Thessaloniki, GREECE, 3 au 5 juillet 2017
 
11 Vatajelu I., Di Natale G., Prinetto P., Zero bit-error-rate weak PUF based on Spin-Transfer-Torque MRAM memories, 2017 IEEE 2nd International Verification and Security Workshop (IVSW 2017), pp. 128-133, Thessaloniki, GREECE, DOI: 10.1109/IVSW.2017.8031552, 3 au 7 juillet 2017
 
12 Vatajelu I., Anghel L., Reliability Analysis of MTJ-based Functional Module for Neuromorphic Computing, International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, GREECE, 3 au 5 juin 2017
 
13 Vatajelu I., Rodriguez-Montanes R., Renovell M., Figueras J., Mitigating Read & Write Errors in STT-MRAM Memories under DVS, European Test Symposium (ETS 2017), Limassol, CYPRUS, 22 au 26 mai 2017
 
14 Mkhinini A., Maistri P., Leveugle R., Tourki R., HLS Design of a Hardware Accelerator for Homomorphic Encryption, IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2017), Dresden, GERMANY, DOI: 10.1109/DDECS.2017.7934578, 19 au 21 avril 2017
 
15 Barbareschi M., Bosio A., Hamdioui S., Nguyen Hoang Anh Du, Traiolla M., Vatajelu I., Memristive devices: Technology, Design Automation and Computing Frontiers, International Conference on Design &Technology of Integrated Systems in Nanoscale Era (DTIS 2017), Palma de Mallorca, SPAIN, 4 au 6 avril 2017
 
16 Sivadasan A., Benhassain A., Huard V., Cacho F., Anghel L., Architecture and Workload Dependant Digital Failure Rate, IEEE International Reliability for Physics of Semiconductors (IRPS 2017), Monterey, UNITED STATES, 2 au 6 avril 2017
 
17 Sivadasan A., Huard V., Anghel L., Worload Dependent Reliability Timing Analysis Flow, DATE 2017, Lausanne, SWITZERLAND, 27 au 29 mars 2017
 
18 Mkhinini A., Maistri P., Leveugle R., Tourki R., Machhout M., A flexible RNS-based large polynomial multiplier for Fully Homomorphic Encryption, 11th IEEE International Design & Test Symposium (IDT'16), pp. 131-136, Hammamet, TUNISIA, 18 au 20 décembre 2016
 
19 Terras L., Teglia Y., Agoyan M., Leveugle R., Taking into account indirect jumps or calls in continuous Control-Flow Checking, 11th IEEE International Design & Test Symposium (IDT'16), pp. 125-130, Hammamet, TUNISIA, 18 au 20 décembre 2016
 
20 Portolan M., Accessing 1687 systems using arbitrary protocols, International Test Conference (ITC'16), Fort Worth, UNITED STATES, DOI: 10.1109/TEST.2016.7805839, 15 au 17 novembre 2016
 
21 Chabot M., Pierre L., Nabais-Moreno A., A Requirement Driven Testing Method for Multi-disciplinary System Design, ACM/IEEE International Conference on Model Driven Engineering Languages and Systems (MODELS'2016), Saint-Malo, FRANCE, 2 au 23 octobre 2016
 
22 Plassan G., Peter H.J., Morin-Allory K., Rahim F., Sarwary S., Borrione D., Conclusively Verifying Clock-Domain Crossings in Very Large Hardware Designs, IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'16) , pp. 1-6, Tallinn, ESTONIA, 26 au 28 septembre 2016
 
23 Chibani K., Portolan M., Leveugle R., Application-aware soft error sensitivity evaluation without fault injections - Application to Leon3, European Conference on Radiation and its Effects on Components and Systems (RADECS'16), Bremen, GERMANY, 19 au 23 septembre 2016
 
24 Pontié S., Bourge A., Prost-Boucle A., Maistri P., Muller O., Leveugle R., Rousseau F., HLS-based methodology for fast iterative development applied to Elliptic Curve arithmetic, Euromicro/IEEE Conference on Digital System Design (DSD'16), pp. 511-518, Limassol, CYPRUS, DOI: 10.1109/DSD.2016.51, 31 août au 2 septembre 2016
 
25 Alexandrescu D., Altun M., Anghel L., Bernasconi A., Ciriani V., Frontini L., Tahoori M., Synthesis and Performance Optimization of a Switching Nano-crossbar Computer, Euromicro Conference on Digital System Design (Euromicro DSD/SEAA'16), Limassol, CYPRUS, 31 août au 2 septembre 2016
 
26 Deng E., Prenat G., Anghel L., Zhao W., Multi-context Non-volatile Content Addressable Memory Using Magnetic Tunnel Junctions, 12th ACM/IEEE International Symposium on Nanoscale Architectures (NANOARCH'16), Beijing, CHINA, 18 au 20 juillet 2016
 
27 Chibani K., Portolan M., Leveugle R., Evaluating Application-Aware Soft Error Effects in Digital Circuits Without Fault Injections or Probabilistic Computations, 22nd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS'16), pp. 54-59, St Feliu de Guixols, SPAIN, 4 au 6 juillet 2016
 
28 Benhassain A., Mhira S., Cacho F., Huard V., Anghel L., In-Situ Slack Monitors : Taking up the Challenge of On-die Monitoring of Variability and Reliability, International Verification and Security Workshop, Sant Feliu de Guixols, SPAIN, 4 au 7 juillet 2016
 
29 Leveugle R., Chahed A., Maistri P., Papadimitriou A., Hély D., Beroulle V., Ammari A., On Fault Injections for Early Security Evaluation vs. Laser-based Attacks, 1st IEEE International Verification and Security Workshop, pp. 33-38, St Feliu de Guixols, SPAIN, 4 au 6 juillet 2016
 
30 Backenstrass T., Blot M., Pontié S., Leveugle R., Protection of ECC Computations against Side-Channel Attacks for Lightweight Implementations, 1st IEEE International Verification and Security Workshop, pp. 2-7, St Feliu de Guixols, SPAIN, 4 au 6 juillet 2016
 
31 Portolan M., Barragan M., Malloug H., Mir S., Interactive Mixed-Signal Testing Through 1687, First International Test Standards Application Workshop (TESTA'16), Amsterdam, NETHERLANDS, 26 au 27 mai 2016
 
32 Thole N., Anghel L., Fey G., A Hybrid Algorithm to Conservatively Check the Robustness of Circuits, IEEE European Test Symposium (ETS'16), Amsterdam, NETHERLANDS, 23 au 26 mai 2016
 
33 Portolan M., A Novel Test Generation and Application Flow for Functional Access to IEEE 1687 instruments, IEEE European Test Symposium (ETS'2016), Amsterdam, NETHERLANDS, DOI: 10.1109/ETS.2016.7519302, 23 au 27 mai 2016
 
34 Portolan M., Rolland R., Student-driven development of a digital tester, European Workshop on Microelectronics Education (EWME'16), pp. 1-3, Southampton, ENGLAND, DOI: 10.1109/EWME.2016.7496479, 11 mai 2016
 
35 Anghel L., Benhassain A., Sivadasan A., Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results, IEEE 34th VLSI Test Symposium (VTS'16), Las Vegas, NE, UNITED STATES, DOI: 10.1109/VTS.2016.7477316, 25 au 27 avril 2016
 
36 Benhassain A., Cacho F., Huard V., Mhira S., Anghel L., Parthasarathy C., Jain A., Sivadasan A., Robustness of Timing in-situ Monitors for AVS Management, IEEE International Reliability Physics Semiconductor (IRPS'16), Passadena, UNITED STATES, 17 au 21 avril 2017
 
37 Benhassain A., Cacho F., Huard V., Anghel L., Early failure prediction by using in-situ monitors: Implementation and application results, Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, Dresden, GERMANY, 18 mars 2016
 
38 Sivadasan A., Cacho F., Benhassain A., Huard V., Anghel L., Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis, Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, Dresden, GERMANY, 18 mars 2016
 
39 Ananiadis C., Papadimitriou A., Hély D., Beroulle V., Maistri P., Leveugle R., On the development of a new countermeasure on a laser attack RTL fault model, Design, Automation and Test in Europe Conference (DATE'16), Dresden, GERMANY, 14 au 18 mars 2016
 
40 Sivadasan A., Cacho F., Benhassain A., Huard V., Anghel L., Study of workload impact on BTI HCI induced aging of digital circuits, Design Automation and Test in Europe (DATE'16), Dresden, GERMANY, 14 au 17 mars 2016
 
41 Jayet-Griffon C., Cornelie M.-A., Maistri P., Elbaz-Vincent P., Leveugle R., Polynomial multipliers for Fully Homomorphic Encryption on FPGA, International Conference on ReConFigurable Computing and FPGAs (ReConFig'15), Mayan Riviera, MEXICO, 7 au 9 décembre 2015
 
42 Benhassain A., Cacho F., Huard V., Saliva M., Anghel L., Parthasarathy C., Jain A., Giner F., Timing in-situ monitors: Implementation strategy and applications results, IEEE Custom Integrated Circuits Conference (ICICC'16), San Jose, CA, UNITED STATES, 28 au 30 septembre 2015
 
43 Chabot M., Mazet K., Pierre L., Automatic and Configurable Instrumentation of C Programs with Temporal Assertion Checkers, 13th ACM-IEEE International Conference on Formal Methods and Models for System Design (MEMOCODE’2015), Austin, Texas, UNITED STATES, 21 au 23 septembre 2015
 
44 Kebaili M., Morin-Allory K., Brignone J.C., Borrione D., Enabler-Based Synchronizer Model for Clock Domain Crossing static Verification, Forum on specification & Design Languages (FDL'15), Barcelona, SPAIN, 14 au 16 septembre 2015
 
45 Javaheri N., Morin-Allory K., Borrione D., Revisiting Regular Expressions in SyntHorus2: from PSL SEREs to Hardware, Forum on specification & Design Languages (FDL'15), Barcelona, SPAIN, 14 au 16 septembre 2015
 
46 Pierre L., Towards a Toolchain for Assertion-Driven Test Sequence Generation, Forum on specification & Design Languages (FDL’2015), Barcelona, SPAIN, 14 au 16 septembre 2015
 
47 Papadimitriou A., Tampas M., Hély D., Beroulle V., Maistri P., Leveugle R., Validation of RTL laser fault injection model with respect to layout information, IEEE International Symposium on Hardware Oriented Security and Trust (HOST'15), pp. 78-81, McLean, VA, UNITED STATES, 5 au 7 mai 2015
 
48 Rehman Saif-Ur, Benabdenbi M., Anghel L., Application-independent testing of multilevel interconnect in mesh-based FPGAs, IEEE 10th International Conference on Design and Technologies for Integrated System in Nanoscale (DTIS'15), pp. 1-6, Naples, ITALY, DOI: 10.1109/DTIS.2015.7127383, 21 au 23 avril 2015
 
49 Saliva M., Cacho F., Ndiaye C., Huard V., Angot D., Bravaix A. , Anghel L., Impact of Gate Oxide Breakdown in Logic Gates from 28nm FDSOI CMOS technology, IEEE International Reliability Physics Symposium (IRPS'15), pp. CA.4.1 - CA.4.6 , Monterrey, CA, UNITED STATES, DOI: 10.1109/IRPS.2015.7112782, 19 au 23 avril 2015
 
50 Papadimitriou A., Hély D., Beroulle V., Maistri P., Leveugle R., Analysis of laser-induced errors: RTL fault model versus layout locality characteristics, Third Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE'15), Grenoble, FRANCE, 13 mars 2015
 
51 Pontié S., Maistri P., Leveugle R., Tuning of randomized windows against simple power analysis for scalar multiplication on elliptic curves, Third Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE'15), Grenoble, FRANCE, 13 mars 2015
 
52 Saliva M., Cacho F., Huard V., Federspiel X., Angot D., Benhassain A., Bravaix A. , Anghel L., Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI, Design, Automation & Test in Europe Conference & Exhibition (DATE'15), pp. 441-446, Grenoble, FRANCE, 9 au 13 mars 2015
 
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3 Chapitres de livre

1 Plassan G., Peter H.J., Morin-Allory K., Sarwary S., Borrione D., Improving the Efficiency of Formal Verification: The Case of Clock-Domain Crossings, VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability, revised selected contributions from 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Hollstein T., Raik J., Kostin S., Tšertov A., O'Connor I., Reis R (Eds.) , Ed. Springer , pp. 108-129, Vol. 508, DOI: 10.1007/978-3-319-67104-8, 2017
 
2 Benabdenbi M., Anghel L., Dimopoulos M., Gang Yi, Adaptive Routing for Fault Tolerance and Congestion Avoidance for 2D Mesh and Torus NoCs in Many-Core Systems-on-Chip, Advances in Microelectronics: Reviews, Sergei Y. Yurish (Eds.) , Ed. IFSA, International Frequency Sensor Association, pp. 405-435, Vol. 1, 2017
 
3 Beroulle V., Candelier P., De Castro S., Di Natale G., Dutertre J.M., Flottes M.-L., Hély D., Hubert G., Leveugle R., Lu F., Maistri P., Papadimitriou A., Rouzeyre B., Tavernier C., Vanhauwaert P., Laser-induced fault effects in security-dedicated circuits, VLSI-SoC: Internet of Things Foundations, L. Claesen, M.-T. Sanz-Pascual, R. Reis, A. Sarmiento-Reyes (Eds.) , Ed. Elsevier, pp. 220-240, Vol. 464, 2015
 
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1 Revues nationales

1 Fesquet L., Morin-Allory K., Robin R., Un projet de microélectronique numérique original : Contrôle autonome d'un micro-drone par caméras externes, J3eA – Journal sur l’enseignement des sciences et technologies de l’information et des systèmes, Ed. EDP Sciences, France, Vol. 14, No. 2009, pp. 9, DOI: 10.1051/j3ea/2015021 , août 2015
 
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7 Autres communications

1 Maistri P., Dutertre J.M., Leveugle R., Laser Attacks against DDR Redundancy, Workshop on SecURity, REliAbiLity, test, prIvacy, Safety and Trust of Future Devices (SURREALIST'2018), Bremen, GERMANY, 2018
 
2 Pontié S., Attaque par analyse de la puissance consommée contre un crypto-processeur basé sur les courbes Jacobi quartiques, Journées Codage et Cryptographie 2015, Toulon, FRANCE, 2015
 
3 Pierre L., Runtime Verification of Embedded Systems Requirements throughout the Design Flow, Ecole d'hiver Francophone sur les Technologies de Conception des Systèmes embarqués Hétérogènes (FETCH'2015), Louvain-La-Neuve , BELGIUM, 2015
 
4 Portolan M., Barragan M., Alhakim R., Mir S., Mixed-Signal BIST computation offloading using IEEE 1687, European Test Symposium (ETS 2017), Limassol, CYPRUS, 2017
 
5 Reynaud V., Maistri P., Leveugle R., Accès autorisé au réseau reconfigurable de test par ensemble de segments, 13ème Colloque du GDR SoC/SiP, Paris, FRANCE, 2018
 
6 Bel Hadj Amor Z., Borrione D., Javaheri N., Morin-Allory K., Pierre L., Design Understanding - At What Abstraction Level is the Pain Most Intense?, Workshop on Design Automation for Understanding Hardware Designs (DUHDe Friday Workshop DATE 2015), Grenoble, FRANCE, 2015
 
7 Anghel L., Paradigm shift in the level of Quality and Reliability in semiconductors to a level smaller than 10ppb, Automotive Reliability and Test Workshop, Fort Worth, UNITED STATES, 2016
 
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5 Logiciels

1 LEVEUGLE R., TIMA Emulation-based Fault Injection plaTform on Virtex-5, Plateforme, 26 juin 2018
 
2 Portolan M., "Manager for Soc Test" (MAST), Logiciel, 2 mai 2018
 
3 Leveugle R., Chibani K., Portolan M., EARS (Evaluation Avancée de Robustesse de Systèmes intégrés / Early Analysis of Robustness for integrated Systems), Logiciel, 30 décembre 2016
 
4 Pierre L., Mazet K., Zian-Cherif A., OSIRIS version 1, Logiciel, 18 mars 2015
 
5 Ferro L., Pierre L., Chabot., Bel Hadj Amor Z., ISIS version 2.1.1, Logiciel, 1 mars 2015
 
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13 Thèses

 1 Morin-Allory K., Assertions and hardware design, HDR, 15 novembre 2018
 
 2 Sivadasan A., Design and Simulation of Digital Circuits in 28nm FDSOI for High Reliability (confidential thesis), These de Doctorat, 29 juin 2018
 
 3 Plassan G., Conclusive formal verification of clock domain crossing properties, These de Doctorat, 28 mars 2018
 
 4 Mkhinini A., Hardware implementation of homomorphic encryption schemes, These de Doctorat, 14 décembre 2017
 
 5 Kebaili M., Reflections on the methodology for verifying multi-clock design : qualitative analysis and automation, These de Doctorat, 25 octobre 2017
 
 6 Benhassain A., Moniteurs de Vieillissement in-situ: Méthodologie d’intégration et application à la gestion dynamique de la fiabilité, These de Doctorat, 29 mai 2017
 
 7 Deng E., Design and development of low-power and reliable logic circuits based on spin-transfer torque magnetic tunnel junctions, These de Doctorat, 10 février 2017
 
 8 Pontié S., Hardware security for cryptography based on elliptic curves, These de Doctorat, 21 novembre 2016
 
 9 Chibani K., Robustness analysis of digital integrated systems, These de Doctorat, 10 novembre 2016
 
10 Rehman Saif-Ur, Development of test and diagnosis techniques for hierarchical mesh-based FPGAs, These de Doctorat, 6 novembre 2015
 
11 Gang Yi, Design of a Network on chip (NoC) that tolerates multiple static and dynamic faults, These de Doctorat, 5 novembre 2015
 
12 Saliva M., Dedicated circuits to aging mechanisms study in avanced CMOS technology nodes: Design and measurements, These de Doctorat, 2 octobre 2015
 
13 Javaheri N., Automatic synthesis of digital circuits from temporal specifications, These de Doctorat, 1 octobre 2015
 
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