TIMA laboratory

Awards


Best Paper Award at 48th International Symposium on Microelectronics (ISM'2015)

Award: "48th International Symposium on Microelectronics"

Authors: Abdelaziz Goulahsen¹, Julien Saadé², Frédéric Pétrot²
¹STMicroelectronics, Grenoble, France
²TIMA Laboratory, Université Grenoble-Alpes, Grenoble, France

Title: Line coding methods for high speed serial links


October 26-29, 2015, Orlando, Florida

 

Best Poster Award at 26th Micromechanics and Microsystems Europe Workshop (MME'2015)

Award: " 26th Micromechanics and Microsystems Europe workshop"

Authors: F. Bernard1,2, F. Casset3, J.S Danel3,C. Chappaz2, S. Basrour1
1Univ. Grenoble Alpes, TIMA Laboratory, F-38031 Grenoble, France CNRS, TIMA Laboratory, F-38031 Grenoble, France
2STMicroelectronics, 850 rue Jean Monnet, 38926 Crolles, France
3CEA, LETI, MINATEC Campus, 38054 Grenoble, France

Title: Characterization of a smartphone size haptic rendering system based on thin-film ALN transduction on glass


September 20-23, 2015, Toledo, Spain

 

Best Paper Award at DATE'2015

Award: Authors: Marine Saliva1, Florian Cacho1, Vincent Huard1, Xavier Federspiel1, Damien Angot1, Ahmed Benhassain1, Alain Bravaix2 and Lorena Anghel3
1STMicroelectronics, FR; 2IM2NP-ISEN, FR; 3TIMA, FR

Title: Digital circuits reliability with in-situ monitors in 28 nm fully depleted SOI

at the Design Automation and Test in Europe (DATE'2015) Conference

Grenoble, France


March 9–13, 2015

 

Best Special Session Award at IEEE 33rd VLSI Test Symposium (VTS'2015)

Award: Authors: Barragan Manuel J., Leger Gildas, Azais Florence, Blanton R.D., Singh Adit D, Sunter Stephen

Title: Special session: Hot topics: Statistical test methods

at IEEE 33rd VLSI Test Symposium (VTS'2015)

Napa - CA - April 27-29, 2015


URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7116265&isnumber=7116233

 

Best Paper Award at the 20th IEEE European Test Symposium (ETS 2015)

Award: Authors: H. Le Gall1, R. Alhakim2, M. Valka2, S. Mir2, H.G. Stratigopoulos2, E. Simeu 2
1STMicroelectronics, FR; 2TIMA, FR

Title: High frequency jitter estimator for SoCs

at 20th IEEE European Test Symposium (ETS 2015)

Cluj-Napoca, Romania, 25-29 May 2015

Le papier est issu d'une collaboration ST Microelectroncis, Grenoble, et TIMA dans le cadre du projet européen ELESIS.

 

Best Paper Award at EFTF'2014

Award: Authors: Haoshen Zhu (CityU), Cheng Tu (CityU), Libor Rufer (TIMA), Joshua E.-Y. Lee (CityU)
Title: "Active Electronic Cancellation of Nonlinearity in a High-Q Longitudinal-Mode Silicon Resonator by Current Biasing" at 28th European Frequency and Time Forum (EFTF'2014) conference (Neuchâtel, Switzerland - June 23-26, 2014

June 23-26, 2014

 

Best Paper Award at DATE'2014

Award: Authors: Sofiane Lagraa (TIMA and LIG), Alexandre Termier (LIG), Frédéric Pétrot (TIMA)
Title: Scalability Bottlenecks Discovery in MPSoC Platforms Using Data Mining on Simulation Traces

at EDAA/IEEE/ACM 17th Design Automation and Test in Europe (DATE'2014) Conference

Dresden, Germany

March 24-28, 2014

 

Best International Thesis Award at IEEE International Test Conference (ITC'2013)

Award: Louay Abdallah, who defended his PhD on october 22nd, 2012, advised by Salvador Mir and Haralampos Stratigopoulos, was awarded the "E. J. McCluskey Best Doctoral Thesis Award" during International Test Conference 2013.

 

Prix international de la meilleure thèse

Award: Louay Abdallah, qui avait soutenu sa thèse le 22 octobre 2012 sous la direction de Salvador Mir et Haralampos Stratigopoulos, a reçu le "E. J. McCluskey Best Doctoral Thesis Award" lors de International Test Conference 2013.

Louay, avant de soutenir, était le représentant des doctorants au Conseil de Laboratoire.

2013