Reliable RF and Mixed-signal Systems
since 2002

Research topics

photo RMS

The expertise of the RMS team is on analog/mixed-signal (AMS) and radiofrequency (RF) integrated circuits and systems, with a focus on embedded test/control techniques and their associated CAD tools. This is especially important for highly integrated devices, such as mixed-signal System-on-Chips (SoCs) that are used today in most applications of the Information Society. The techniques that we develop aim at reducing production test costs, increasing production yield, enhancing quality, reliability and robustness. Our activities span three scientific research axes ; “Design-for-test of analog/mixed-signal/RF circuits”, “Computer-Aided Test (CAT) and “embedded control heterogeneous AMS/RF systems” including modeling of heterogeneous systems at different abstraction levels. Our expertise in this domain allows us to obtain results that not only have pioneered the research field and are considered state-of-the-art, but also have reached industrial exploitation. The relevance of this research is confirmed by Best Paper Awards in major International Conferences in each of the three research axes during the last years. Our team is involved in various national and European research and development projects and has long lasting collaborations with many foreign Universities.

Last publications

Silveira Feitoza R., Strategies for Reduced-code Static Testing of SAR ADCs Strategies, These de Doctorat, 2021
Chegari B., Tabaa M., Simeu E., Moutaouakkil F., Medromi H., Multi-objective optimization of building energy performance and indoor thermal comfort by combining artificial neural networks and metaheuristic algorithms, Energy and Buildings, Ed. Elsevier, Vol. 239, pp. 110839, DOI: 10.1016/j.enbuild.2021.110839, 2021
Margalef-Rovira M., Occello O., Saadi A., Avramovic V., Lepilliet S., Vincent L., Barragan M., Pistono E., Bourdel S., Gaquière C., Ferrari P., Mm-wave through-load element for on-wafer measurement applications, IEEE Transactions on Circuits and Systems, Ed. IEEE, Vol. , pp. 1-14, DOI: 10.1109/TCSI.2021.3072097, 2021
Melis T., Simeu E., Auvray E., Armagnat P., Analog and mixed-signal circuits simulation for product level EMMI analysis, Microelectronics Reliability, Ed. Elsevier, Vol. 114, DOI: 10.1016/j.microrel.2020.113881, 2020
Melis T., Simeu E., Auvray E., Analog and Mixed Signal Diagnosis Flow Using Fault Isolation Techniques and Simulation, 46th International Symposium for Testing and Failure Analysis (ISTFA 2020), Virtual event, UNITED STATES, 2020
Annual activity report