Reliable Mixed-signal Systems
since 2002

Research topics

photo RMS

The expertise of the RMS team is on analog/mixed-signal (AMS) and radiofrequency (RF) integrated circuits and systems, with a focus on embedded test/control techniques and their associated CAD tools. This is especially important for highly integrated devices, such as mixed-signal System-on-Chips (SoCs) that are used today in most applications of the Information Society. The techniques that we develop aim at reducing production test costs, increasing production yield, enhancing quality, reliability and robustness. Our activities span three scientific research axes ; “Design-for-test of analog/mixed-signal/RF circuits”, “Computer-Aided Test (CAT) and “embedded control heterogeneous AMS/RF systems” including modeling of heterogeneous systems at different abstraction levels. Our expertise in this domain allows us to obtain results that not only have pioneered the research field and are considered state-of-the-art, but also have reached industrial exploitation. The relevance of this research is confirmed by Best Paper Awards in major International Conferences in each of the three research axes during the last years. Our team is involved in various national and European research and development projects and has long lasting collaborations with many foreign Universities.

Team leader

SIMEU Emmanuel

Last publications

Cilici F., Barragan M., Mir S., Lauga-Larroze E., Bourdel S., Leger G., Yield Recovery of mm-Wave Power Amplifiers using Variable Decoupling Cells and One-Shot Statistical Calibration, IEEE International Symposium on Circuits and Systems (ISCAS 2019), pp. 1-5, Sapporo, JAPAN, 2019
Margalef-Rovira M., Barragan M., Pistono E., Bourdel S., Ferrari P., Conception de déphaseurs RTPS faible consommation en bande millimétrique, 21èmes Journées Nationales Micro-ondes (JNM 2019), Caen, FRANCE, 2019
Bounceur A., Mir S., Euler R., Beznia K., Estimation of Analog/RF Parametric Test Metrics Based on a Multivariate Extreme Value Model (Early Access), IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Ed. IEEE, Vol. , DOI: 10.1109/TCAD.2019.2907923, 2019
Barragan M., Leger G., Cilici F., Lauga-Larroze E., Bourdel S., Mir S., On the use of causal feature selection in the context of machine-learning indirect test, Design, Automation & Test in Europe Conference & Exhibition (DATE 2019), pp. 276-279, Florence, ITALY, 2019
Silveira Feitoza R., Barragan M., Dzahini D., Mir S., Reduced-code static linearity test of split-capacitor SAR ADCs using an embedded incremental Sigma-Delta converter, IEEE Transactions on Device and Materials Reliability, Vol. 19, No. 1, pp. 37-45, DOI: 10.1109/TDMR.2019.2891298, 2019
Annual activity report