Research

RMS

Reliable Mixed-signal Systems
since 2002


Research topics

photo RMS

The expertise of the RMS team is on analog/mixed-signal (AMS) and radiofrequency (RF) integrated circuits and systems, with a focus on embedded test/control techniques and their associated CAD tools. This is especially important for highly integrated devices, such as mixed-signal System-on-Chips (SoCs) that are used today in most applications of the Information Society. The techniques that we develop aim at reducing production test costs, increasing production yield, enhancing quality, reliability and robustness. Our activities span three scientific research axes ; “Design-for-test of analog/mixed-signal/RF circuits”, “Computer-Aided Test (CAT) and “embedded control heterogeneous AMS/RF systems” including modeling of heterogeneous systems at different abstraction levels. Our expertise in this domain allows us to obtain results that not only have pioneered the research field and are considered state-of-the-art, but also have reached industrial exploitation. The relevance of this research is confirmed by Best Paper Awards in major International Conferences in each of the three research axes during the last years. Our team is involved in various national and European research and development projects and has long lasting collaborations with many foreign Universities.

Team leader

SIMEU Emmanuel

Last publications

Silveira Feitoza R., Barragan M., Mir S., Reduced-Code Techniques for On-Chip Static Linearity Test of SAR ADCs, 27th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), Cuzco, PERU, 2019
 
Sharma E., Saadi A., Barragan M., Pistono E., Margalef-Rovira M., Lisboa de Souza A.A., Ferrari P., Bourdel S., Design of a 77-GHz LC-VCO With a Slow-Wave Coplanar Stripline-Based Inductor, IEEE Transactions on Circuits and Systems, Ed. IEEE, Vol. , pp. 1-11, DOI: 10.1109/TCSI.2019.2926415, 2019
 
Cilici F., Leger G., Barragan M., Mir S., Lauga-Larroze E., Bourdel S., Efficient generation of data sets for one-shot statistical calibration of RF/mm-wave circuits, International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD 2019), Lausanne, SWITZERLAND, Hot topic session, 2019
 
Barragan M., Leger G., Feature selection and feature design for machine learning indirect test: a tutorial review, International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD 2019), Lausanne, SWITZERLAND, Hot topic session, 2019
 
Barragan M., Built-In Self-Test solutions for high-performance and reliable analog, mixed-signal, and RF integrated circuits, HDR, 2019
 
Annual activity report