Research

RMS

Reliable Mixed-signal Systems
since 2002


Research topics

photo RMS

The expertise of the RMS team is on analog/mixed-signal (AMS) and radiofrequency (RF) integrated circuits and systems, with a focus on embedded test/control techniques and their associated CAD tools. This is especially important for highly integrated devices, such as mixed-signal System-on-Chips (SoCs) that are used today in most applications of the Information Society. The techniques that we develop aim at reducing production test costs, increasing production yield, enhancing quality, reliability and robustness. Our activities span three scientific research axes ; “Design-for-test of analog/mixed-signal/RF circuits”, “Computer-Aided Test (CAT) and “embedded control heterogeneous AMS/RF systems” including modeling of heterogeneous systems at different abstraction levels. Our expertise in this domain allows us to obtain results that not only have pioneered the research field and are considered state-of-the-art, but also have reached industrial exploitation. The relevance of this research is confirmed by Best Paper Awards in major International Conferences in each of the three research axes during the last years. Our team is involved in various national and European research and development projects and has long lasting collaborations with many foreign Universities.

Team leader

SIMEU Emmanuel

Last publications

Malloug H., Design of embedded sinusoidal signal generators for mixed signal Built-in Self-Test, These de Doctorat, 2018
 
Tchuani Tchakonte D., Simeu E., Thuente M., Lifetime optimization of wireless sensor networks with sleep mode energy consumption of sensor nodes, Wireless Networks, Ed. Springer , Vol. ISSN 1022-0038, pp. 1-10, DOI: 10.1007/s11276-018-1783-3, 2018
 
Youssoufa M., Foutse M., Lealea T., Njike Kouekeu L. C., Tueche F., Simeu E., Accuracy enhancement in low frequency gain and phase detector (AD8302) based bioimpedance spectroscopy system, Measurement, Vol. 123, pp. 304-308, 2018
 
Malloug H., Barragan M., Mir S., Practical Harmonic Cancellation Techniques for the On-Chip Implementation of Sinusoidal Signal Generators for Mixed-Signal BIST Applications, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. , DOI: 10.1007/s10836-018-5720-2, 2018
 
Barragan M., Eisenstadt W. (Eds.), Guest Editorial: Analog, Mixed-Signal and RF Testing, Special issue of Journal of Electronic Testing, Ed. Springer , 2017
 
Annual activity report