Research

RIS

Robust Integrated Systems
since 2015


Research topics

photo RIS

RIS addresses the fundamental challenges induced by aggressive nanometric scaling, including: high defect densities caused by increasing process, voltage and temperature variations, accelerated aging, EMI and soft errors; as well as stringent power constraints imposed by fast increasing power densities and temperatures, and battery-life requirements in mobile applications.
To address these challenges, the RIS group works at multiple levels of system architecture for developing robust design approaches (and tools for their qualification), including: circuit, bloc, microarchitecture, array-level, and software. Our goals are multiple, and concern the development and use of self-healing and self-adapting approaches for: mitigating fabrication faults (in particular those induced by process variations), to improve fabrication yield; mitigating field failures (in particular those induced by aging) to increase product lifetime, as well as those induced by voltage and temperature variations, EMI and soft errors to improve reliability; operating the circuits at aggressively low voltage levels to aggressively reduce power.

Team leader

VELAZCO Raoul

Last publications

Velazco R., Mcmorrow D., Estela J. (Eds.), Radiation Effects on Integrated Circuits and Systems for Space Applications, pp. 401 pages, Ed. Springer , 2019
 
Ramos P., Vargas V., Velazco R., Zergainoh N.-E., Error Rate Prediction of Applications Implemented in Multi-Core and Many-Core Processors, Radiation Effects on Integrated Circuits and Systems for Space Applications, Velazco R., McMorrow D., Estela J. (Eds.) , Ed. Springer , pp. 145-173, Vol. 2, 2019
 
Vargas V., Ramos P., Méhaut J-F., Velazco R., Improving Reliability of Multi-/Many-Core Processors by Using NMR-MPar Approach, Radiation Effects on Integrated Circuits and Systems for Space Applications, Velazco R., McMorrow D., Estela J. (Eds.) , Ed. Springer , pp. 175-203, DOI: 10.1007/978-3-030-04660-6_8, 2019
 
Gizopoulos D., Alexandrescu D., Nicolaidis M. (Eds.), Guest Editorial: Robust System Design - IEEE International On-Line Testing and Robust System Design Symposium (IOLTS) 2018, IEEE Transactions on Device and Materials Reliability, Vol. 19 - Issue 1, pp. 3-5, Ed. IEEE, 2019
 
Vargas V., Ramos P., Velazco R., Evaluation by Neutron Radiation of the NMR-MPar Fault-Tolerance Approach Applied to Applications Running on a 28-nm Many-Core Processor, Electronics Letters, Ed. IEEE, Vol. 7, No. 11, DOI: 10.3390/electronics7110312, 2018
 
Annual activity report