Robust Integrated Systems
since 2015

Research topics

photo RIS

RIS addresses the fundamental challenges induced by aggressive nanometric scaling, including: high defect densities caused by increasing process, voltage and temperature variations, accelerated aging, EMI and soft errors; as well as stringent power constraints imposed by fast increasing power densities and temperatures, and battery-life requirements in mobile applications.
To address these challenges, the RIS group works at multiple levels of system architecture for developing robust design approaches (and tools for their qualification), including: circuit, bloc, microarchitecture, array-level, and software. Our goals are multiple, and concern the development and use of self-healing and self-adapting approaches for: mitigating fabrication faults (in particular those induced by process variations), to improve fabrication yield; mitigating field failures (in particular those induced by aging) to increase product lifetime, as well as those induced by voltage and temperature variations, EMI and soft errors to improve reliability; operating the circuits at aggressively low voltage levels to aggressively reduce power.

Team leader


Last publications

Coelho A., Fault Tolerance and Reliability for Partially Connected 3D Networks-on-Chip, These de Doctorat, 2019
Coelho A., Charif A., Zergainoh N.-E., Velazco R., FL-RuNS: A High Performance and Runtime Reconfigurable Fault-Tolerant Routing Schemes for Partially-Connected 3D Networks-on-Chip, IEEE transactions on Nanotechnology, Ed. IEEE, Vol. 18, pp. 806-818, DOI: 10.1109/TNANO.2019.2931271, 2019
Garay Trindade M., Coelho A., Valadares C., Andreoni Camponogara Viera R., Rey S., Cheymol B., Baylac M., Velazco R., Possamai Bastos R., Assessment of a Hardware-Implemented Machine Learning Technique under Neutron Irradiation, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. , 2019
Velazco R., Mcmorrow D., Estela J. (Eds.), Radiation Effects on Integrated Circuits and Systems for Space Applications, pp. 401 pages, Ed. Springer , 2019
Ramos P., Vargas V., Velazco R., Zergainoh N.-E., Error Rate Prediction of Applications Implemented in Multi-Core and Many-Core Processors, Radiation Effects on Integrated Circuits and Systems for Space Applications, Velazco R., McMorrow D., Estela J. (Eds.) , Ed. Springer , pp. 145-173, Vol. 2, 2019
Annual activity report