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High-level fault injection to assess FMEA on critical systems

Author(s): J. Roux, V. Beroulle, K. Morin-Allory, R. Leveugle, L. Bossuet, F. Cezilly, F. Berthoz, G. Genevrier, F. Cerisier

Journal: Microelectronics Reliability

Volume: 122

Pages: 114135

Doi : 10.1016/j.microrel.2021.114135