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RF Front-End Test Using Built-in Sensors

Author(s): L. Abdallah, H. Stratigopoulos, S. Mir, C. Kelma

Journal: IEEE Design and Test of Computers

Volume: 28

Issue: 6

Pages: 76-84

Doi : 10.1109/MDT.2011.131

This article proposes a new class of sensors for built-in test in RF devices. These sensors are placed in close proximity to the DUT on the same substrate without being electrically connected to it. Instead, they monitor it by virtue of being subjected to the same process variations. The authors also describe other types of sensors they have studied, including DC probes, an envelope detector, and a current sensor.