< back to publications

Rebooting Computing: The Challenges for Test and Reliability

Author(s): A. Bosio, S. Hamdioui, I. O'Connor, G. Rodrigues, F. Lima, I. Vatajelu, G. Di Natale, L. Anghel, S. Nagarajan, M.R. Fieback

Doc. Source: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT'2019)

Pages: 8138-8143

Doi : 10.1109/DFT.2019.8875270

Today's computer architectures and semiconductor technologies are facing major challenges making them incapable to deliver the required features (such as computer efficiency) for emerging applications. Alternative architectures are being under investigation in order to continue deliver sustainable benefits for the foreseeable future society at affordable cost. These architectures are not only changing the traditional computing paradigm (e.g., in terms of programming models, compilers, circuit design), but also setting up new challenges and directions on the way these architectures should be tested to guarantee the required quality and reliability levels. This paper highlights the major open questions regarding test and reliability of three emerging computing paradigms being approximate computing, computation-in-memory and neuromorphic computing.