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Yield Recovery of mm-Wave Power Amplifiers using Variable Decoupling Cells and One-Shot Statistical Calibration

Author(s): F. Cilici, M. Barragan, S. Mir, E. Lauga-Larroze, S. Bourdel, G. Leger

Doc. Source: IEEE International Symposium on Circuits and Systems (ISCAS 2019)

Publisher: IEEE

Pages: 1-5