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Robustness of Timing in-situ Monitors for AVS Management

Author(s): A. Benhassain, F. Cacho, V. Huard, S. Mhira, L. Anghel, C. Parthasarathy, A. Jain, A. Sivadasan

Doc. Source: IEEE International Reliability Physics Semiconductor (IRPS'16)

Publisher: Academic Press, London, UK