Publications

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Cost-efficient Testing of LUT and Intra-cluster Interconnect of a Novel SRAM-based FPGA

Author(s): Saif-Ur Rehman, M. Benabdenbi, L. Anghel

Doc. Source: Colloque National System-On-Chip System-In-Package (SoC-SiP'13)

Publisher: LIRMM & TU Darmstadt