Publications
Publications
Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach
Author(s): R. Kheriji, V. Danelon, J.L. Carbonero, S. Mir
Doc. Source: IEEE Design, Automation and Test in Europe Conference (DATE'05)
Publisher: IEEE
Pages: 170-171
Doi : 10.1109/DATE.2005.233
This paper is aimed at studying defect-oriented test techniques for RF components in order to optimize production test sets. This study is mandatory for the definition of an efficient test flow strategy. We have carried out a fault simulation campaign for a Low-Noise Amplifier (LNA) for reducing a test set while maintaining high fault coverage. The set of production test measurements should include low-cost structural tests such as simple current consumption and only a few more sophisticated tests dedicated to functional specifications such as S parameters, Noise Figure (NF) or IP3.