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« Techniques for the evaluation and the improvement of emergent technologies’ behaviour facing random errors ».

Author: E. Costenaro
Advisor: M. Nicolaidis
Co-advisor: D. Alexandrescu
President of jury: S. Mir
thesis reviewer(s): A. Dandache, M. Violante,
These de Doctorat Université de Grenoble
Speciality: Micro et Nano Electronique
Defense: December 09 2015
ISBN: 978-2-11-129206-2

Abstract

The main objective of this thesis is to develop analysis and mitigation techniques that can be used to face the effects of radiation-induced soft errors external and internal disturbances produced by radioactive particles, affecting the reliability and safety in operation complex microelectronic circuits. This thesis aims to provide industrial solutions and methodologies for the areas of terrestrial applications requiring ultimate reliability (telecommunications, medical devices, ...) to complement previous work on Soft Errors traditionally oriented aerospace, nuclear and military applications. The work presented uses a decomposition of the error sources, inside the current circuits, to highlight the most important contributors. Single Event Effects in sequential logic cells represent the current target for analysis and improvement efforts in both industry and academia. This thesis presents a state-aware analysis methodology that improves the accuracy of Soft Error Rate data for individual sequential instances based on the circuit and application. Furthermore, the intrinsic imbalance between the SEU susceptibility of different flip-flop states is exploited to implement a low-cost SER improvement strategy. Single Event Transients affecting combinational logic are considerably more difficult to model, simulate and analyze than the closely-related Single Event Upsets. The working environment may cause a myriad of distinctive transient pulses in various cell types that are used in widely different configurations. This thesis presents practical approach to a possible exhaustive Single Event Transient evaluation flow in an industrial setting. The main steps of this process consists in: a) fully characterize the standard cell library using a process and library-aware SER tool, b) evaluate SET effects in the logic networks of the circuit using a variety dynamic (simulation-based) and static (probabilistic) methods and c) compute overall SET figures taking into account the particularities of the implementation of the circuit and its environment. Fault-injection remains the primary method for analyzing the effects of soft errors. This document presents the results of functional analysis of a complex CPU. Three representative benchmarks were considered for this analysis. Accelerated simulation techniques (probabilistic calculations, clustering, parallel simulations) have been proposed and evaluated in order to develop an industrial validation environment, able to take into account very complex circuits. The results obtained allowed the development and evaluation of a hypothetical mitigation scenario that aims to significantly improve the reliability of the circuit at the lowest cost. The results obtained show that the error rate, SDC (Silent Data Corruption) and DUE (Detectable Uncorrectable Errors) can be significantly reduced by hardening a small part of the circuit (Selective mitigation). In addition to the main axis of research, some tangential topics were studied in collaboration with other teams. One of these consisted in the study of a technique for the mitigation of flip-flop softerrors through an optimization of the Temporal De-Rating (TDR) by selectively inserting delay on the input or output of flip-flops. The Methodologies, the algorithms and the CAD tools proposed and validated as part of the work are intended for industrial use and have been included in a commercial CAD framework that offers a complete solution for assessing the reliability of circuits and complex electronic systems.

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