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« BIST technique for CMOS imagers ».

Author: L. Lizarraga
Advisor: S. Mir
Co-advisor: G. Sicard
President of jury: B. Courtois
These de Doctorat Grenoble INP
Speciality: Micro et Nano Electronique
Defense: November 27 2008
ISBN: 978-2-84813-127-6

Abstract

The production test of the CMOS imagers is realized with testers that use light sources precise. This need make the imagers test complicated and expensive. Moreover, these kinds of tests can not be realised directly on the imager in order to incorporate auto test functions. These functions are interesting for the reduction of the production test costs and for the diagnosis of the imager. The diagnosis is important during the production and when the imagers have been submitted to important stress sources. In general, the users of the imagers seldom own the equipment necessary to verify its functionality. In this work, we study and evaluate a Built-In-Self-Test (BIST) technique for the CMOS vision sensors. This technique realises a structural test of the imager. The structural test is based on electrical stimuli applied to the photodiode anode and to the pixel transistors. The BIST quality is evaluated by the test metrics that takes into account process variations and the presence of catastrophic and single parametric faults. The BIST is evaluated for two kinds of imagers, the first one uses integrations pixels and the second one logarithmic pixels. An experimental validation is done for the logarithmic imager.

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