PhD Thesis

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« Simulation Tools for Transient Faults ».

Author: D. Alexandrescu
Advisor: M. Nicolaidis
President of jury: P. Gentil
thesis reviewer(s): M. Sonza-Reorda, L. Entrena-Arrontes,
These de Doctorat Institut National Polytechnique de Grenoble - INPG
Speciality: Micro et Nano Electronique
Defense: September 24 2007
ISBN: 978-2-84813-107-8


Single Events (SE) are produced by the interaction of charged particles with the transistors of a microelectronic circuit. These perturbations may alter the functioning of the circuit and cause logic faults and errors. As the sensitivity of circuits increases for each technological evolution, specific tools are needed for the design of hardened circuits. This thesis aim at furthering the comprehension of the phenomena and proposes EDA tools to help the analysis of these problems in today’s ICs. We have developed methodologies for the characterization of the cells from the standard library and tools for accelerated fault simulation and probabilistic analysis of single events. The results provided by these tools allow the designer to correctly evaluate the sensitivity of his design and select the most adequate methods to improve the reliability of ICs.