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« Design of a programmable analog and mixed-signal BIST architecture in deep submicron technology ».

Author: G. Prenat
Advisor: B. Courtois
These de Doctorat Institut National Polytechnique de Grenoble - INPG
Speciality: Micro et Nano Electronique
Defense: November 18 2005
ISBN: ISBN 2-84813-075-X
Pages: 145


This report presents a BIST technique for harmonic testing of Analogue and Mixed-Signal (AMS) circuits. The interface of the BIST is fully digital. This approach is aimed at facilitating low-cost test techniques for System-on-Chip (SoC) devices, rendering the test of mixed-signal cores compatible with the use of a low-cost digital tester. Analogue test signal generation is performed on-chip by low pass filtering a Sigma-Delta encoded bit-stream. Analogue harmonic test response analysis is also performed on-chip using square wave modulation and Sigma-Delta modulation. Since both analogue signal generation and test response analysis are digitally programmable on-chip, compatibility with a low-cost digital tester is ensured. Optimisation of test signatures is discussed in detail as a trade-off between test time and test quality.

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