33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT'2020) (DFT)

Date: October 19-21, 2020
Venue: Frascati (Roma), ITALY
Rank: A

technical program committee: ANGHEL L., DI NATALE Giorgio

Summary: DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest.

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