Research

CDSI

Circuits, Devices and System Integration
since 2015


Research topics

photo CDSI

The Circuits, Devices and System Integration (CDSI) axis is involved in the design, fabrication and test of integrated devices, circuits and systems. The main driver of the activity is focused on the research in energy consumption and in miniaturized devices and systems. Results of this research are applicable for portable and autonomous systems, which usually require low-power consumption, miniaturization, robustness and security. Indeed, our digital society, which offers large communication facilities to people, tends to enlarge the communication to machines and small communicating objects such as wireless sensor nodes (Internet of Things). This will multiply by several orders of magnitude the amount of energy consumed by the digital objects and will push the industry to foster new approach for mitigating the power consumption. In this context, the CIS (Concurrent Integrated Systems) and MNS (Micro and Nano Systems) teams developed new techniques based on asynchronous circuitry, non-uniform sampling schemes, energy harvesting and low-power sensors and actuators.


Last publications

Aquino Guazzelli R., Garay Trindade M., Fesquet L., Possamai Bastos R., Learning-Based Reliability Assessment Method for Detection of Permanent Faults in Clockless Circuits, Microelectronics Reliability, Ed. Elsevier, Vol. , 2019
 
Possamai Bastos R., Torres F.S. (Eds.), On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits, pp. 1-162, Ed. Springer , 2019
 
Fesquet L., Decoudu Y., Iga R., Ferreira De Paiva Leite T., Rolloff O., Diallo M., Possamai Bastos R., Morin-Allory K., Engels S., A Distributed Body-Biasing Strategy for Asynchronous Circuits, 27th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC 2019), Cuzco, PERU, 2019
 
Andreoni Camponogara Viera R., Maurine P., Dutertre J.M., Possamai Bastos R., Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault-Injection, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Ed. IEEE, Vol. , 2019
 
Possamai Bastos R., Dutertre J.M., Garay Trindade M., Andreoni Camponogara Viera R., Potin O., Rey S., Cheymol B., Baylac M., Assessment of Current Sensor on Chip for Detecting Neutron-Induced Transients via Body Terminals, Conference on Radiation Effects on Components and Systems (RADECS 2019), Montpellier, FRANCE, 2019
 
Annual activity report