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143 results

  21 International journals
   1 Patents
  19 Invited conference talks
  69 International conferences
   5 Book chapters
   1 National journals
   1 National conferences
   8 Other communications
   5 Softwares
  13 PhD theses

21 International journals

 1 Galy P., De Conti L., Delahaye G., Anghel L., Topology and design investigation on thin film silicon BIMOS device for ESD protection in FD-SOI technology, Microelectronics Reliability, Ed. Elsevier, Vol. , DOI: 10.1016/j.microrel.2019.06.069, Septembre 2019
 
 2 Vallero A., Savino A., Chatzidimitriou A., Kaliorakis M., Kooli M., Riera V., Di Natale G., Bosio A., Canal R., Gizopoulos D., Di Carlo S., Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems, IEEE Transactions on Computers, Ed. IEEE, Vol. 68, No. 5, pp. 765-783, DOI: 10.1109/TC.2018.2887225, May 2019
 
 3 Kooli M., Di Natale G., Bosio A., Memory-Aware Design Space Exploration for Reliability Evaluation in Computing Systems, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. , DOI: 10.1007/s10836-019-05785-0, March 2019
 
 4 Vatajelu I., Di Natale G., High-Entropy STT-MTJ-based TRNG, IEEE Transactions on Very Large Scale Integration (VLSI) Systems , Ed. IEEE, Vol. , DOI: 10.1109/TVLSI.2018.2879439, February 2019
 
 5 Valea E., Da Silva M., Di Natale G., Flottes M.-L., Rouzeyre B., A Survey on Security Threats and Countermeasures in IEEE Test Standards, IEEE Design & Test, Ed. IEEE, Vol. 36, No. 3, pp. 95-116, DOI: 10.1109/MDAT.2019.2899064, January 2019
 
 6 Plassan G., Morin-Allory K., Borrione D., Mining Missing Assumptions from Counter-Examples, Transactions on Embedded Computing Systems (TECS), Ed. ACM, NY, USA, Vol. 18, No. 1, DOI: 10.1145/3288759, January 2019
 
 7 Martin H., Peris-Lopez P., Di Natale G., Taouil M., Hamdioui S., Enhancing PUF Based Challenge-Response Sets by Exploiting Various Background Noise Configurations, MDPI Electronics, Ed. MDPI, Vol. 8, No. 2, DOI: 10.3390/electronics8020145, January 2019
 
 8 Dutertre J.M., Beroulle V., Candelier P., De Castro S., Faber L.-B., Flottes M.-L., Gendrier P., Hély D., Leveugle R., Maistri P., Di Natale G., Papadimitriou A., Sensitivity to Laser Fault Injection: CMOS FD-SOI vs. CMOS bulk (Early Access), IEEE Transactions on Device and Materials Reliability, Vol. , DOI: 10.1109/TDMR.2018.2886463, December 2018
 
 9 Anghel L., Benabdenbi M., Bosio A., Traiola M., Vatajelu I., Test and Reliability in Approximate Computing, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. 34, No. 4, pp. 375-387, DOI: 10.1007/s10836-018-5734-9, August 2018
 
10 Leveugle R., Mkhinini A., Maistri P., Hardware Support for Security in the Internet of Things: From Lightweight Countermeasures to Accelerated Homomorphic Encryption, Information - Open Access Journal of Information Science, Ed. MDPI, Vol. 9, No. 5, pp. 114, DOI: 10.3390/info9050114, May 2018
 
11 Mkhinini A., Maistri P., Leveugle R., Tourki R., Co-designed accelerator for homomorphic encryption applications, Advances in Science, Technology and Engineering Systems Journal (ASTESJ), Vol. 3, No. 1, pp. 426-433, DOI: 10.25046/aj030152, February 2018
 
12 Vatajelu I., Prinetto P., Taouil M., Hamdioui S., Challenges and Solutions in Emerging Memory Testing, IEEE Transactions on Emerging Topics in Computing, Ed. IEEE, Vol. PP, No. 99, DOI: 10.1109/TETC.2017.2691263, 2017
 
13 Vatajelu I., Pouyan P., Hamdioui S., State of the art and challenges for test and reliability of emerging nonvolatile resistive memories, International Journal of Circuit Theory and Applications, Ed. Wiley, Chichester, UK, Vol. 46, No. 1, pp. 4-28, DOI: 10.1002/cta.2418, October 2017
 
14 Alexandrescu D., Altun M., Anghel L., Ciriani V., Tahoori M., Bernasconi A., Logic synthesis and testing techniques for switching nano-crossbar arrays, Microprocessors and Microsystems, Ed. Elsevier, Vol. 54, pp. 14-25, DOI: 10.1016/j.micpro.2017.08.004, October 2017
 
15 Javaheri N., Morin-Allory K., Borrione D., Synthesis of Regular Expressions Revisited: from PSL SEREs to Hardware, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Ed. IEEE, Vol. 36, No. 5, pp. 869-882, DOI: 10.1109/TCAD.2016.2600241 , May 2017
 
16 Deng E., Prenat G., Anghel L., Non-Volatile Magnetic Decider Based on Magnetic Tunnel Junctions, Electronics Letters, Ed. IEEE, Vol. , 2016
 
17 Pontié S., Maistri P., Leveugle R., Dummy operations in scalar multiplication over elliptic curves: a tradeoff between security and performance, Microprocessors and Microsystems, Ed. Elsevier, Vol. 47, No. Part A, pp. 23-36, DOI: 10.1016/j.micpro.2016.02.016, November 2016
 
18 Papadimitriou A., Hély D., Beroulle V., Maistri P., Leveugle R., Analysis of laser-induced errors: RTL fault models versus layout locality characteristics, Microprocessors and Microsystems, Ed. Elsevier, Vol. 47, No. Part A, pp. 64-73, DOI: 10.1016/j.micpro.2016.01.018, November 2016
 
19 Pierre L., Auxiliary Variables in Temporal Specifications: Semantic and Practical Analysis for System-Level Requirements, Transactions on Design Automation of Electronic Systems (TODAES), Ed. ACM, NY, USA, Vol. 21, No. 2, pp. Article n°20, DOI: 10.1145/2811260, January 2016
 
20 Morin-Allory K., Javaheri N., Borrione D., Efficient and Correct by Construction Assertion-Based Synthesis, Transactions on Very Large Scale Integration (VLSI) Systems, Ed. IEEE, Vol. 23, No. 12, pp. 2890-290, DOI: 10.1109/TVLSI.2014.2386212, December 2015
 
21 Ottavi M., Pontarelli S., Gizopoulos D., Bolchini C., Michael M.K., Anghel L., Tahoori M., Paschalis A., Reviriego P., Bringmann O., Izosimov V., Manhaeve H., Strydis C., Hamdioui S., Dependable Multicore Architectures at Nanoscale: The View From Europe , IEEE Design & Test, Ed. IEEE, Vol. 32, No. 2, pp. 17-28, DOI: 10.1109/MDAT.2014.2359572, April 2015
 
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1 Patents

1 Portolan M., Test apparatus and method for testing an integrated circuit, No. 17/54491, 19 May 2017
 
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19 Invited conference talks

 1 Anghel L., Managing Aging Induced Reliability at Run-time, Invited Talk, 7th Workshop on Cross-layer Resiliency (IWCR'2019), Stuttgart, GERMANY, 29 to 31 July 2019
 
 2 Anghel L., Embedded Hardware Architectures for AI, Invited Talk, From Brain and Cognition to Artificial Intelligence Workshop, Grenoble, FRANCE, 4 June 2019
 
 3 Maistri P., Secure Test Architectures in IoT, Invited Talk, European Nanoelectronics Applications, Design & Technology Conference (ADTC 2019), Dresden, GERMANY, 14 to 16 May 2019
 
 4 Anghel L., Run-time Age Induced Reliability Prediction for SOC, Invited Talk, IEEE Latin America Test Symposium (LATS 2019), Santiago de Chile, CHILI, 11 to 13 March 2019
 
 5 Anghel L., Neuromorphic Circuits, Séminaire invité, L’Intelligence Naturelle au cœur des enjeux de l’Intelligence Artificielle – Les atouts du site grenoblois, Grenoble, FRANCE, 13 July 2018
 
 6 Di Natale G., Kooli M., Bosio A., Portolan M., Leveugle R., Reliability of computing systems: from flip flops to variables, Invited talk (Special Session), 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, GREECE, DOI: 10.1109/IOLTS.2017.8046242, 3 to 5 July 2017
 
 7 Anghel L., Benabdenbi M., Bosio A., Vatajelu I., Test and reliability in approximate computing, Invited paper, Mixed Signals Testing Workshop (IMSTW 2017), Thessaloniki, GREECE, DOI: 10.1109/IMS3TW.2017.7995210, 3 to 5 July 2017
 
 8 Leveugle R., New approaches towards early dependability evaluation of digital integrated systems, Invited Tutorial, 11th IEEE International Design & Test Symposium (IDT'16), Hammamet, TUNISIA, 18 to 20 December 2016
 
 9 Maistri P., Countermeasures against Implementation Attacks on Private- and Public-Key Cryptosystems, Keynote in the Opening Session, International Conference on Applications and Techniques in Information Security, Cairns, AUSTRALIA, 26 to 28 October 2016
 
10 Anghel L., Portolan M., Managing Wear out and Variability Monitors: IEEE 1687 to the Rescue, Keynote talk, East West Design and test Symposium, Yerevan, ARMENIA, 13 to 16 October 2016
 
11 Leveugle R., DFT vs. Security - Is it a Contradiction? How Can We Get the Best of Both Worlds?, Invited Talk, 1st IEEE International Verification and Security Workshop, St Feliu de Guixols, SPAIN, 4 to 6 July 2016
 
12 Pontié S., Prise en compte des fuites d’informations par canaux auxiliaires dans une implémentation ECC, Invited Talk, Séminaire sécurité des systèmes électroniques embarqués, Rennes, FRANCE, 27 June 2016
 
13 Portolan M., System Level Coordination of Multiple-Standard DfT, Invited Talk, Test Standards Application Workshop (TESTA’16), Amsterdam, NETHERLANDS, 28 May 2016
 
14 Anghel L., System Failure Prediction with On-Chip Monitors, Plenary talk, Colloque National 2016 de GDR SOC-SIP, Nantes, FRANCE, 7 to 8 May 2016
 
15 Portolan M., Standards: Can they co-exist for System Level Test?, Invited Talk, VLSI Test Symposium, Las Vegas, NE, UNITED STATES, 25 to 27 April 2016
 
16 Borrione D., Automatic Synthesis of Verification IP's from Assertions: Beyond Observers, 19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS'16), Košice, SLOVENIA, 20 to 22 April 2016
 
17 Anghel L., Moniteurs de fiabilité embarqués en technologie FDSOI: Implémentation et Applications, Invited Talk, Ecole d'hiver Francophone sur les Technologies de Conception des Systèmes Embarqués Hétérogènes (FETCH'16), Vilard de Lans, FRANCE, 4 to 7 January 2016
 
18 Borrione D., Morin-Allory K., Liu M., Oddos Y., Morin-Allory K., Javaheri N., Verification and Synthesis of Digital Systems from Assertions, Ecole d'hiver Francophone sur les Technologies de Conception des Systèmes embarqués Hétérogènes (FETCH'16), Villards de Lans, FRANCE, 1 January 2016
 
19 Anghel L., Reliability Measurements with In Situ Aging Monitors in FDSOI Technology, Invited talk (Elevator talk), International Test Conference (ITC'15), Anaheim, UNITED STATES, 6 to 8 October 2015
 
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69 International conferences

 1 Damljanovic A., Jutman A., Portolan M., Sanchez E., Squillero G., Tsertov A., Simulation-based Equivalence Checking between IEEE 1687 ICL and RTL, International Test Conference (ITC 2019), Washington DC, UNITED STATES, 11 to 14 November 2019
 
 2 Shah A., Cacho F., Anghel L., Aging Investigation of Digital Circuits using In-Situ Monitors, IEEE International Integrated Reliability Workshop (IIRW 2019), Stanford Sierra, Fallen Leaf Lake, UNITED STATES, 13 to 17 October 2019
 
 3 Bosio A., Hamdioui S., O'Connor I., Rodrigues G., Lima F., Vatajelu I., Di Natale G., Anghel L., Nagarajan S., Fieback M.R., Rebooting Computing: The Challenges for Test and Reliability, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT'2019), pp. 8138-8143, Noordwijk, NETHERLANDS, DOI: 10.1109/DFT.2019.8875270 , 2 to 4 October 2019
 
 4 Galy P., De Conti L., Vinet M., Cristoloveanu S., Delahaye G., Anghel L., Topology and design investigation on thin film silicon BIMOS device for ESD protection in FD-SOI technology, 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'2019), Toulouse, FRANCE, 23 to 26 Septembre 2019
 
 5 Merandat M., Reynaud V., Valea E., Quévremont J., Maistri P., Leveugle R., Flottes M.-L., Dupuis S., Rouzeyre B., Di Natale G., A Comprehensive Approach to a Trusted Test Infrastructure, 4th International Verification and Security Workshop (IVSW 2019), Rhodes Island, GREECE, 1 to 3 July 2019
 
 6 Portolan M., Savino A., Leveugle R., Di Carlo S., Bosio A., Di Natale G., Alternatives to fault injections for early safety/security evaluations, 24th IEEE European Test Symposium (ETS 2019), Baden Baden, GERMANY, 27 to 31 May 2019
 
 7 Savino A., Portolan M., Leveugle R., Di Carlo S., Approximate computing design exploration through data lifetime metrics, 24th IEEE European Test Symposium (ETS 2019), Baden Baden, GERMANY, 27 to 31 May 2019
 
 8 Mosanu S., Guo X., Anghel L., Stan M., Flexi-AES: A Highly-Parameterizable Cipher for a Wide Range of Design Constraints, IEEE 27th Annual International Symposium on Field-Programmable Custom Computing Machines (FCCM'2019), San Diego, UNITED STATES, 28 April to 1 May 2019
 
 9 Valea E., Da Silva M., Flottes M.-L., Di Natale G., Rouzeyre B., Encryption-Based Secure JTAG, IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2019), Cluj Napoca, ROMANIA, 24 to 26 April 2019
 
10 Vatajelu I., Di Natale G., Anghel L., Special Session: Reliability of Hardware-Implemented Spiking Neural Networks (SNN), IEEE VLSI Test Symposium (VTS 2019), Monterey, UNITED STATES, 23 to 25 April 2019
 
11 Skaf A., Ezzadeen M., Benabdenbi M., Fesquet L., On-Line Adjustable Precision Computing, Design & Technologies of Integrated Systems (DTIS 2019), Mykonos, GREECE, 16 to 18 April 2019
 
12 Valea E., Da Silva M., Flottes M.-L., Di Natale G., Rouzeyre B., Dupuis S., Providing Confidentiality and Integrity in Ultra Low Power IoT Devices, 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS 2019), Mykonos, GREECE, DOI: 10.1109/DTIS.2018.8368561, 16 to 18 April 2019
 
13 Skaf A., Ezzadeen M., Benabdenbi M., Fesquet L., Adjustable Precision Computing Using Redundant Arithmetic, Workshop on Approximate Computing (AxC'2019), Florence, ITALY, 29 March 2019
 
14 Savino A., Portolan M., Di Carlo S., Leveugle R., Targeting approximation through data lifetime: a quest for optimization metrics, 4th Approximate Computing Workshop (AxC 2019), Florence, ITALY, 29 March 2019
 
15 Di Natale G., Vatajelu I., Senthamarai Kannan K., Anghel L., Hidden-Delay-Fault Sensor for Test, Reliability and Security, IEEE Design Automation and Test Conference in Europe (DATE 2019), Florence, ITALY, 25 to 29 March 2019
 
16 Anghel L., Di Natale G., Miramond B., Vatajelu I., Vianello E., Neuromorphic Computing - From Robust Hardware Architectures to Testing Strategies, 26th IFIP IEEE International Conference on Very Large Scale Integration (VLSI SOC 2018), Verona, ITALY, 8 to 10 October 2018
 
17 Dutertre J.M., Beroulle V., Candelier P., De Castro S., Faber L.-B., Flottes M.-L., Gendrier P., Hély D., Leveugle R., Maistri P., Di Natale G., Papadimitriou A., Rouzeyre B., Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model, Fourteenth Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC'2018), Amsterdam, NETHERLANDS, 13 Septembre 2018
 
18 Morgül Muhammed Ceylan, Frontini L., Vatajelu I., Anghel L., Integrated Synthesis Methodology for Crossbar Arrays, IEEE NANOARCH'2018, Athens, GREECE, 18 to 19 July 2018
 
19 Vatajelu I., Anghel L., Portal J.-M., Bocquet M., Prenat G., Resistive and Spintronic RAMs: Device, Simulation, and Applications, IEEE International On Line Testing (IOLTS'2018), Platja d'Aro, SPAIN, 2 to 4 July 2018
 
20 Dutertre J.M., Beroulle V., Candelier P., De Castro S., Faber L.-B., Flottes M.-L., Gendrier P., Hély D., Leveugle R., Maistri P., Di Natale G., Papadimitriou A., Rouzeyre B., The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks, 24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS'2018), Platja d'Aro, SPAIN, 2 to 4 July 2018
 
21 Sivadasan A., Shah R., Cacho F., Anghel L., NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI, Design Automation and Test in Europe (DATE'2018), Dresden, GERMANY, 19 to 23 March 2018
 
22 Shah R., Cacho F., Anghel L., Investigation of speed sensors accuracy for process and aging compensation, IEEE International reliability Physics Symposium (IRPS'2018), San Francisco, UNITED STATES, 11 to 15 March 2018
 
23 Plassan G., Morin-Allory K., Borrione D., Extraction of missing formal assumptions in under-constrained designs, 15th ACM-IEEE International Conference on Formal Methods and Models for System Design (MEMOCODE 2017), pp. 94-103, Vienna, AUSTRIA, DOI: 10.1145/3127041.3127046, 29 Septembre to 2 October 2017
 
24 Pierre L., Chabot M., Assertion-Based Verification for SoC Models and Identification of Key Events, Euromicro Conference on Digital System Design (DSD 2017), Vienna, AUSTRIA, 30 August to 1 Septembre 2017
 
25 Vatajelu I., Anghel L., Fully-Connected Single-Layer STT-MTJ-based Spiking Neural Network under Process Variability, ACM/IEEE International Symposium on Nanoscale Architectures (NANOARCH 2017), Newport, RI, UNITED STATES, 25 to 29 July 2017
 
26 Cacho F., Benhassain A., Shah R., Huard V., Anghel L., Investigation of critical path selection for in-situ monitors insertion, 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), pp. 247-252, Thessaloniki, GREECE, 3 to 5 July 2017
 
27 Vatajelu I., Di Natale G., Prinetto P., Zero bit-error-rate weak PUF based on Spin-Transfer-Torque MRAM memories, 2017 IEEE 2nd International Verification and Security Workshop (IVSW 2017), pp. 128-133, Thessaloniki, GREECE, DOI: 10.1109/IVSW.2017.8031552, 3 to 7 July 2017
 
28 Vatajelu I., Anghel L., Reliability Analysis of MTJ-based Functional Module for Neuromorphic Computing, International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, GREECE, 3 to 5 June 2017
 
29 Vatajelu I., Rodriguez-Montanes R., Renovell M., Figueras J., Mitigating Read & Write Errors in STT-MRAM Memories under DVS, European Test Symposium (ETS 2017), Limassol, CYPRUS, 22 to 26 May 2017
 
30 Portolan M., Barragan M., Alhakim R., Mir S., Mixed-Signal BIST computation offloading using IEEE 1687, European Test Symposium (ETS 2017), Limassol, CYPRUS, 22 to 26 May 2017
 
31 Mkhinini A., Maistri P., Leveugle R., Tourki R., HLS Design of a Hardware Accelerator for Homomorphic Encryption, IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2017), Dresden, GERMANY, DOI: 10.1109/DDECS.2017.7934578, 19 to 21 April 2017
 
32 Barbareschi M., Bosio A., Hamdioui S., Nguyen Hoang Anh Du, Traiola M., Vatajelu I., Memristive devices: Technology, Design Automation and Computing Frontiers, International Conference on Design &Technology of Integrated Systems in Nanoscale Era (DTIS 2017), Palma de Mallorca, SPAIN, 4 to 6 April 2017
 
33 Sivadasan A., Benhassain A., Huard V., Cacho F., Anghel L., Architecture and Workload Dependant Digital Failure Rate, IEEE International Reliability for Physics of Semiconductors (IRPS 2017), Monterey, UNITED STATES, 2 to 6 April 2017
 
34 Sivadasan A., Huard V., Anghel L., Worload Dependent Reliability Timing Analysis Flow, DATE 2017, Lausanne, SWITZERLAND, 27 to 29 March 2017
 
35 Mkhinini A., Maistri P., Leveugle R., Tourki R., Machhout M., A flexible RNS-based large polynomial multiplier for Fully Homomorphic Encryption, 11th IEEE International Design & Test Symposium (IDT'16), pp. 131-136, Hammamet, TUNISIA, 18 to 20 December 2016
 
36 Terras L., Teglia Y., Agoyan M., Leveugle R., Taking into account indirect jumps or calls in continuous Control-Flow Checking, 11th IEEE International Design & Test Symposium (IDT'16), pp. 125-130, Hammamet, TUNISIA, 18 to 20 December 2016
 
37 Portolan M., Accessing 1687 systems using arbitrary protocols, International Test Conference (ITC'16), Fort Worth, UNITED STATES, DOI: 10.1109/TEST.2016.7805839, 15 to 17 November 2016
 
38 Chabot M., Pierre L., Nabais-Moreno A., A Requirement Driven Testing Method for Multi-disciplinary System Design, ACM/IEEE International Conference on Model Driven Engineering Languages and Systems (MODELS'2016), Saint-Malo, FRANCE, 2 to 23 October 2016
 
39 Plassan G., Peter H.J., Morin-Allory K., Rahim F., Sarwary S., Borrione D., Conclusively Verifying Clock-Domain Crossings in Very Large Hardware Designs, IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'16) , pp. 1-6, Tallinn, ESTONIA, 26 to 28 Septembre 2016
 
40 Chibani K., Portolan M., Leveugle R., Application-aware soft error sensitivity evaluation without fault injections - Application to Leon3, European Conference on Radiation and its Effects on Components and Systems (RADECS'16), Bremen, GERMANY, 19 to 23 Septembre 2016
 
41 Pontié S., Bourge A., Prost-Boucle A., Maistri P., Muller O., Leveugle R., Rousseau F., HLS-based methodology for fast iterative development applied to Elliptic Curve arithmetic, Euromicro/IEEE Conference on Digital System Design (DSD'16), pp. 511-518, Limassol, CYPRUS, DOI: 10.1109/DSD.2016.51, 31 August to 2 Septembre 2016
 
42 Alexandrescu D., Altun M., Anghel L., Bernasconi A., Ciriani V., Frontini L., Tahoori M., Synthesis and Performance Optimization of a Switching Nano-crossbar Computer, Euromicro Conference on Digital System Design (Euromicro DSD/SEAA'16), Limassol, CYPRUS, 31 August to 2 Septembre 2016
 
43 Deng E., Prenat G., Anghel L., Zhao W., Multi-context Non-volatile Content Addressable Memory Using Magnetic Tunnel Junctions, 12th ACM/IEEE International Symposium on Nanoscale Architectures (NANOARCH'16), Beijing, CHINA, 18 to 20 July 2016
 
44 Chibani K., Portolan M., Leveugle R., Evaluating Application-Aware Soft Error Effects in Digital Circuits Without Fault Injections or Probabilistic Computations, 22nd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS'16), pp. 54-59, St Feliu de Guixols, SPAIN, 4 to 6 July 2016
 
45 Benhassain A., Mhira S., Cacho F., Huard V., Anghel L., In-Situ Slack Monitors : Taking up the Challenge of On-die Monitoring of Variability and Reliability, International Verification and Security Workshop, Sant Feliu de Guixols, SPAIN, 4 to 7 July 2016
 
46 Leveugle R., Chahed A., Maistri P., Papadimitriou A., Hély D., Beroulle V., Ammari A., On Fault Injections for Early Security Evaluation vs. Laser-based Attacks, 1st IEEE International Verification and Security Workshop, pp. 33-38, St Feliu de Guixols, SPAIN, 4 to 6 July 2016
 
47 Backenstrass T., Blot M., Pontié S., Leveugle R., Protection of ECC Computations against Side-Channel Attacks for Lightweight Implementations, 1st IEEE International Verification and Security Workshop, pp. 2-7, St Feliu de Guixols, SPAIN, 4 to 6 July 2016
 
48 Portolan M., Barragan M., Malloug H., Mir S., Interactive Mixed-Signal Testing Through 1687, First International Test Standards Application Workshop (TESTA'16), Amsterdam, NETHERLANDS, 26 to 27 May 2016
 
49 Thole N., Anghel L., Fey G., A Hybrid Algorithm to Conservatively Check the Robustness of Circuits, IEEE European Test Symposium (ETS'16), Amsterdam, NETHERLANDS, 23 to 26 May 2016
 
50 Portolan M., A Novel Test Generation and Application Flow for Functional Access to IEEE 1687 instruments, IEEE European Test Symposium (ETS'2016), Amsterdam, NETHERLANDS, DOI: 10.1109/ETS.2016.7519302, 23 to 27 May 2016
 
51 Portolan M., Rolland R., Student-driven development of a digital tester, European Workshop on Microelectronics Education (EWME'16), pp. 1-3, Southampton, ENGLAND, DOI: 10.1109/EWME.2016.7496479, 11 May 2016
 
52 Anghel L., Benhassain A., Sivadasan A., Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results, IEEE 34th VLSI Test Symposium (VTS'16), Las Vegas, NE, UNITED STATES, DOI: 10.1109/VTS.2016.7477316, 25 to 27 April 2016
 
53 Benhassain A., Cacho F., Huard V., Mhira S., Anghel L., Parthasarathy C., Jain A., Sivadasan A., Robustness of Timing in-situ Monitors for AVS Management, IEEE International Reliability Physics Semiconductor (IRPS'16), Passadena, UNITED STATES, 17 to 21 April 2017
 
54 Benhassain A., Cacho F., Huard V., Anghel L., Early failure prediction by using in-situ monitors: Implementation and application results, Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, Dresden, GERMANY, 18 March 2016
 
55 Sivadasan A., Cacho F., Benhassain A., Huard V., Anghel L., Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis, Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, Dresden, GERMANY, 18 March 2016
 
56 Ananiadis C., Papadimitriou A., Hély D., Beroulle V., Maistri P., Leveugle R., On the development of a new countermeasure on a laser attack RTL fault model, Design, Automation and Test in Europe Conference (DATE'16), Dresden, GERMANY, 14 to 18 March 2016
 
57 Sivadasan A., Cacho F., Benhassain A., Huard V., Anghel L., Study of workload impact on BTI HCI induced aging of digital circuits, Design Automation and Test in Europe (DATE'16), Dresden, GERMANY, 14 to 17 March 2016
 
58 Jayet-Griffon C., Cornelie M.-A., Maistri P., Elbaz-Vincent P., Leveugle R., Polynomial multipliers for Fully Homomorphic Encryption on FPGA, International Conference on ReConFigurable Computing and FPGAs (ReConFig'15), Mayan Riviera, MEXICO, 7 to 9 December 2015
 
59 Benhassain A., Cacho F., Huard V., Saliva M., Anghel L., Parthasarathy C., Jain A., Giner F., Timing in-situ monitors: Implementation strategy and applications results, IEEE Custom Integrated Circuits Conference (ICICC'16), San Jose, CA, UNITED STATES, 28 to 30 Septembre 2015
 
60 Chabot M., Mazet K., Pierre L., Automatic and Configurable Instrumentation of C Programs with Temporal Assertion Checkers, 13th ACM-IEEE International Conference on Formal Methods and Models for System Design (MEMOCODE’2015), Austin, Texas, UNITED STATES, 21 to 23 Septembre 2015
 
61 Kebaili M., Morin-Allory K., Brignone J.C., Borrione D., Enabler-Based Synchronizer Model for Clock Domain Crossing static Verification, Forum on specification & Design Languages (FDL'15), Barcelona, SPAIN, 14 to 16 Septembre 2015
 
62 Javaheri N., Morin-Allory K., Borrione D., Revisiting Regular Expressions in SyntHorus2: from PSL SEREs to Hardware, Forum on specification & Design Languages (FDL'15), Barcelona, SPAIN, 14 to 16 Septembre 2015
 
63 Pierre L., Towards a Toolchain for Assertion-Driven Test Sequence Generation, Forum on specification & Design Languages (FDL’2015), Barcelona, SPAIN, 14 to 16 Septembre 2015
 
64 Papadimitriou A., Tampas M., Hély D., Beroulle V., Maistri P., Leveugle R., Validation of RTL laser fault injection model with respect to layout information, IEEE International Symposium on Hardware Oriented Security and Trust (HOST'15), pp. 78-81, McLean, VA, UNITED STATES, 5 to 7 May 2015
 
65 Rehman Saif-Ur, Benabdenbi M., Anghel L., Application-independent testing of multilevel interconnect in mesh-based FPGAs, IEEE 10th International Conference on Design and Technologies for Integrated System in Nanoscale (DTIS'15), pp. 1-6, Naples, ITALY, DOI: 10.1109/DTIS.2015.7127383, 21 to 23 April 2015
 
66 Saliva M., Cacho F., Ndiaye C., Huard V., Angot D., Bravaix A. , Anghel L., Impact of Gate Oxide Breakdown in Logic Gates from 28nm FDSOI CMOS technology, IEEE International Reliability Physics Symposium (IRPS'15), pp. CA.4.1 - CA.4.6 , Monterrey, CA, UNITED STATES, DOI: 10.1109/IRPS.2015.7112782, 19 to 23 April 2015
 
67 Papadimitriou A., Hély D., Beroulle V., Maistri P., Leveugle R., Analysis of laser-induced errors: RTL fault model versus layout locality characteristics, Third Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE'15), Grenoble, FRANCE, 13 March 2015
 
68 Pontié S., Maistri P., Leveugle R., Tuning of randomized windows against simple power analysis for scalar multiplication on elliptic curves, Third Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE'15), Grenoble, FRANCE, 13 March 2015
 
69 Saliva M., Cacho F., Huard V., Federspiel X., Angot D., Benhassain A., Bravaix A. , Anghel L., Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI, Design, Automation & Test in Europe Conference & Exhibition (DATE'15), pp. 441-446, Grenoble, FRANCE, 9 to 13 March 2015
 
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5 Book chapters

1 Anghel L., Shah R., Cacho F., On-Chip Ageing Monitoring and System Adaptation, Ageing of Integrated Circuits: Causes, Effects and Mitigation TechniquesOn-Chip Ageing Monitoring and System Adaptation, B. Halak (Eds.) , Ed. , pp. 149-180, DOI: 10.1007/978-3-030-23781-3_6, 2019
 
2 Kiamehr S., Tahoori M., Anghel L., Manufacturing Threats, Dependable Multicore Architectures at Nanoscale, Marco Ottavi / Dimitris Gizopoulos / Salvatore Pontarelli (Eds.) , Ed. Springer , pp. 3-35, DOI: 10.1007/978-3-319-54422-9, 2017
 
3 Plassan G., Peter H.J., Morin-Allory K., Sarwary S., Borrione D., Improving the Efficiency of Formal Verification: The Case of Clock-Domain Crossings, VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability, revised selected contributions from 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Hollstein T., Raik J., Kostin S., Tšertov A., O'Connor I., Reis R (Eds.) , Ed. Springer , pp. 108-129, Vol. 508, DOI: 10.1007/978-3-319-67104-8, 2017
 
4 Benabdenbi M., Anghel L., Dimopoulos M., Gang Yi, Adaptive Routing for Fault Tolerance and Congestion Avoidance for 2D Mesh and Torus NoCs in Many-Core Systems-on-Chip, Advances in Microelectronics: Reviews, Sergei Y. Yurish (Eds.) , Ed. IFSA, International Frequency Sensor Association, pp. 405-435, Vol. 1, 2017
 
5 Beroulle V., Candelier P., De Castro S., Di Natale G., Dutertre J.M., Flottes M.-L., Hély D., Hubert G., Leveugle R., Lu F., Maistri P., Papadimitriou A., Rouzeyre B., Tavernier C., Vanhauwaert P., Laser-induced fault effects in security-dedicated circuits, VLSI-SoC: Internet of Things Foundations, L. Claesen, M.-T. Sanz-Pascual, R. Reis, A. Sarmiento-Reyes (Eds.) , Ed. Elsevier, pp. 220-240, Vol. 464, 2015
 
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1 National journals

1 Fesquet L., Morin-Allory K., Rolland-Girod R., Un projet de microélectronique numérique original : Contrôle autonome d'un micro-drone par caméras externes, J3eA – Journal sur l’enseignement des sciences et technologies de l’information et des systèmes, Ed. EDP Sciences, France, Vol. 14, No. 2009, pp. 9, DOI: 10.1051/j3ea/2015021 , August 2015
 
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1 National conferences

1 Reynaud V., Maistri P., Leveugle R., Accès autorisé au réseau reconfigurable de test par ensemble de segments, 13ème Colloque du GDR SoC/SiP, Paris, FRANCE, 13 to 15 June 2018
 
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8 Other communications

1 Maistri P., Dutertre J.M., Leveugle R., Laser Attacks against DDR Redundancy, Workshop on SecURity, REliAbiLity, test, prIvacy, Safety and Trust of Future Devices (SURREALIST'2018), Bremen, GERMANY, 2018
 
2 Pontié S., Attaque par analyse de la puissance consommée contre un crypto-processeur basé sur les courbes Jacobi quartiques, Journées Codage et Cryptographie 2015, Toulon, FRANCE, 2015
 
3 Portolan M., Cantoro R., Sanchez E., A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks, European Test Symposium (ETS 2019), Baden Baden, GERMANY, 2019
 
4 Pierre L., Runtime Verification of Embedded Systems Requirements throughout the Design Flow, Ecole d'hiver Francophone sur les Technologies de Conception des Systèmes embarqués Hétérogènes (FETCH'2015), Louvain-La-Neuve , BELGIUM, 2015
 
5 Bel Hadj Amor Z., Borrione D., Javaheri N., Morin-Allory K., Pierre L., Design Understanding - At What Abstraction Level is the Pain Most Intense?, Workshop on Design Automation for Understanding Hardware Designs (DUHDe Friday Workshop DATE 2015), Grenoble, FRANCE, 2015
 
6 Portolan M., Cantoro R., Sanchez E., Sonza Reorda M., A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks, International Test Conference (ITC 2018), Phoenix, UNITED STATES, 2018
 
7 Maistri P., Hardware Design of Error Detection Schemes for Symmetric Ciphers, Séminaire sécurité des systèmes électroniques embarqués, Rennes, FRANCE, 2016
 
8 Anghel L., Paradigm shift in the level of Quality and Reliability in semiconductors to a level smaller than 10ppb, Automotive Reliability and Test Workshop, Fort Worth, UNITED STATES, 2016
 
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5 Softwares

1 Portolan M., "Manager for Soc Test" (MAST), Logiciel, 2 May 2018
 
2 Leveugle R., Chibani K., Portolan M., EARS (Evaluation Avancée de Robustesse de Systèmes intégrés / Early Analysis of Robustness for integrated Systems), Logiciel, 30 December 2016
 
3 Leveugle R., AMfoRS' TIMA Emulation-based Fault Injection plaTform on Virtex-5, Plateforme, 26 June 2015
 
4 Pierre L., Mazet K., Zian-Cherif A., OSIRIS version 1, Logiciel, 18 March 2015
 
5 Ferro L., Pierre L., Chabot., Bel Hadj Amor Z., ISIS version 2.1.1, Logiciel, 1 March 2015
 
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13 PhD theses

 1 Morin-Allory K., Assertions and hardware design, HDR, 15 November 2018
 
 2 Sivadasan A., Design and Simulation of Digital Circuits in 28nm FDSOI for High Reliability (confidential thesis - unavailable online), These de Doctorat, 29 June 2018
 
 3 Plassan G., Conclusive formal verification of clock domain crossing properties, These de Doctorat, 28 March 2018
 
 4 Mkhinini A., Hardware implementation of homomorphic encryption schemes, These de Doctorat, 14 December 2017
 
 5 Kebaili M., Reflections on the methodology for verifying multi-clock design : qualitative analysis and automation, These de Doctorat, 25 October 2017
 
 6 Benhassain A., Moniteurs de Vieillissement in-situ: Méthodologie d’intégration et application à la gestion dynamique de la fiabilité, These de Doctorat, 29 May 2017
 
 7 Deng E., Design and development of low-power and reliable logic circuits based on spin-transfer torque magnetic tunnel junctions, These de Doctorat, 10 February 2017
 
 8 Pontié S., Hardware security for cryptography based on elliptic curves, These de Doctorat, 21 November 2016
 
 9 Chibani K., Robustness analysis of digital integrated systems, These de Doctorat, 10 November 2016
 
10 Rehman Saif-Ur, Development of test and diagnosis techniques for hierarchical mesh-based FPGAs, These de Doctorat, 6 November 2015
 
11 Gang Yi, Design of a Network on chip (NoC) that tolerates multiple static and dynamic faults, These de Doctorat, 5 November 2015
 
12 Saliva M., Dedicated circuits to aging mechanisms study in avanced CMOS technology nodes: Design and measurements, These de Doctorat, 2 October 2015
 
13 Javaheri N., Automatic synthesis of digital circuits from temporal specifications, These de Doctorat, 1 October 2015
 
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