Architectures and Methods for Resilient Systems
since 2015

Research topics

photo AMfoRS

The AMfoRS team targets crucial challenges regarding resilient integrated systems. Our goal is twofold: guarantee that systems will not behave unexpectedly and ensure a substantial level of robustness and security. Our work aims at increasing the synergies between verification technologies and activities on the design and validation of reliable, safe and secure integrated systems, with a focus on digital parts.
The expected outcomes of our research include methods, tools and hardware blocks necessary to justify trust in increasingly complex integrated systems and even cyber-physical systems.
The team takes part in several scientific challenges identified not only at the laboratory level, but also in the Research "poles" of University Grenoble-Alpes (especially the MSTIC pole) and more generally at the national level (French strategic directions) and international level (in particular European H2020 priorities).

Last publications

Shah A., Cacho F., Anghel L., Aging Investigation of Digital Circuits using In-Situ Monitors, IEEE International Integrated Reliability Workshop (IIRW 2019), Stanford Sierra, Fallen Leaf Lake, UNITED STATES, 2019
Vatajelu I., Di Natale G., High-Entropy STT-MTJ-based TRNG, IEEE Transactions on Very Large Scale Integration (VLSI) Systems , Ed. IEEE, Vol. , DOI: 10.1109/TVLSI.2018.2879439, 2019
Merandat M., Reynaud V., Valea E., Quévremont J., Maistri P., Leveugle R., Flottes M.-L., Dupuis S., Rouzeyre B., Di Natale G., A Comprehensive Approach to a Trusted Test Infrastructure, 4th International Verification and Security Workshop (IVSW 2019), Rhodes Island, GREECE, 2019
Valea E., Da Silva M., Di Natale G., Flottes M.-L., Rouzeyre B., A Survey on Security Threats and Countermeasures in IEEE Test Standards, IEEE Design & Test, Ed. IEEE, Vol. 36, No. 3, pp. 95-116, DOI: 10.1109/MDAT.2019.2899064, 2019
Vallero A., Savino A., Chatzidimitriou A., Kaliorakis M., Kooli M., Riera V., Di Natale G., Bosio A., Canal R., Gizopoulos D., Di Carlo S., Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems, IEEE Transactions on Computers, Ed. IEEE, Vol. 68, No. 5, pp. 765-783, DOI: 10.1109/TC.2018.2887225, 2019
Annual activity report