Research

RMS

Reliable Mixed-signal Systems
since 2002


Research topics

photo RMS

The expertise of the RMS team is on analog/mixed-signal (AMS) and radiofrequency (RF) integrated circuits and systems, with a focus on embedded test/control techniques and their associated CAD tools. This is especially important for highly integrated devices, such as mixed-signal System-on-Chips (SoCs) that are used today in most applications of the Information Society. The techniques that we develop aim at reducing production test costs, increasing production yield, enhancing quality, reliability and robustness. Our activities span three scientific research axes ; “Design-for-test of analog/mixed-signal/RF circuits”, “Computer-Aided Test (CAT) and “embedded control heterogeneous AMS/RF systems” including modeling of heterogeneous systems at different abstraction levels. Our expertise in this domain allows us to obtain results that not only have pioneered the research field and are considered state-of-the-art, but also have reached industrial exploitation. The relevance of this research is confirmed by Best Paper Awards in major International Conferences in each of the three research axes during the last years. Our team is involved in various national and European research and development projects and has long lasting collaborations with many foreign Universities.

Team leader

SIMEU Emmanuel

Last publications

Chegari B., Tabaa M., Moutaouakkil F., Simeu E., Medromi H., Local energy self-sufficiency for passive buildings: Case study of a typical Moroccan building, Journal of Building Engineering, Ed. Elsevier, Vol. 29, No. 101164, DOI: 10.1016/j.jobe.2019.101164, 2020
 
Simeu E., Jurimagi L., Velazco R. (Eds.), Proceedings of the 20th Latin-American Test Symposium (LATS 2019), Ed. IEEE, 2019
 
Cilici F., Development of Built-In Self-Test solutions for RF/mm-wave integrated circuits, These de Doctorat, 2019
 
Nzebop Ndenoka G., Tchuente M., Simeu E., Langage et sémantique des expressions pour la synthèse de modèle Grafcet dans un environnement IDM, Conférence de Recherche en Informatique (CRI 2019), Yaoundé, CAMEROON, 2019
 
Tchuani Tchakonte D., Simeu E., Tchuente M., Optimization of wireless sensor network lifetime for target coverage applications, Conférence de Recherche en Informatique 2019 (CRI 2019), Yaoundé, CAMEROON, 2019
 
Annual activity report