Reliable RF and Mixed-signal Systems
since 2002

Research topics

photo RMS

The expertise of the RMS team is on analog/mixed-signal (AMS) and radiofrequency (RF) integrated circuits and systems, with a focus on embedded test/control techniques and their associated CAD tools. This is especially important for highly integrated devices, such as mixed-signal System-on-Chips (SoCs) that are used today in most applications of the Information Society. The techniques that we develop aim at reducing production test costs, increasing production yield, enhancing quality, reliability and robustness. Our activities span three scientific research axes ; “Design-for-test of analog/mixed-signal/RF circuits”, “Computer-Aided Test (CAT) and “embedded control heterogeneous AMS/RF systems” including modeling of heterogeneous systems at different abstraction levels. Our expertise in this domain allows us to obtain results that not only have pioneered the research field and are considered state-of-the-art, but also have reached industrial exploitation. The relevance of this research is confirmed by Best Paper Awards in major International Conferences in each of the three research axes during the last years. Our team is involved in various national and European research and development projects and has long lasting collaborations with many foreign Universities.

Last publications

El-Chaar M., Lisboa de Souza A.A., Barragan M., Podevin F., Bourdel S., A Non-Closed-Form Mathematical Model for Uniform and Non-Uniform Distributed Amplifiers, IEEE MTT-S International Conference on Microwaves for Intelligent Mobility (ICMIM 2020), Linz, AUSTRIA, DOI: 10.1109/ICMIM48759.2020.9299099, 2020
Margalef-Rovira M., Lugo-Alvarez J., Bautista A., Vincent L., Lepilliet S., Saadi A., Podevin F., Barragan M., Pistono E., Bourdel S., Gaquière C., Ferrari P., Design of mm-Wave Slow-wave Coupled Coplanar Waveguides, IEEE Transactions on Microwave Theory and Techniques, Ed. IEEE, Vol. , DOI: 10.1109/TMTT.2020.3015974, 2020
Takam Tchendjou G., Simeu E., Detection, Location and Concealment of Defective Pixels in Image Sensors, IEEE Transactions on Emerging Topics in Computing, Ed. IEEE, Vol. , DOI: 10.1109/TETC.2020.2976807, 2020
Troussier C., Bourgeat J., Simeu E., Arnould J.D., Jimenez J., Jacquier B., Study of Inter-Power Domain Failures during a CDM Event, IEEE 42nd EOS/ESD symposium (ESDA 2020), Virginia St, Reno, UNITED STATES, 2020
Margalef-Rovira M., Design of mm-wave Reflection-Type Phase Shifters with Oscillation-Based Test capabilities, These de Doctorat, 2020
Annual activity report