Reliable Mixed-signal Systems

Research topics

photo RMS

The expertise of the RMS team is on analog/mixed-signal (AMS) and radiofrequency (RF) integrated circuits and systems, with a focus on embedded test/control techniques and their associated CAD tools. This is especially important for highly integrated devices, such as mixed-signal System-on-Chips (SoCs) that are used today in most applications of the Information Society. The techniques that we develop aim at reducing production test costs, increasing production yield, enhancing quality, reliability and robustness. Our activities span three scientific research axes ; “Design-for-test of analog/mixed-signal/RF circuits”, “Computer-Aided Test (CAT) and “embedded control heterogeneous AMS/RF systems” including modeling of heterogeneous systems at different abstraction levels. Our expertise in this domain allows us to obtain results that not only have pioneered the research field and are considered state-of-the-art, but also have reached industrial exploitation. The relevance of this research is confirmed by Best Paper Awards in major International Conferences in each of the three research axes during the last years. Our team is involved in various national and European research and development projects and has long lasting collaborations with many foreign Universities.

Team leader

SIMEU Emmanuel

Last publications

Barragan M., Eisenstadt W., Guest Editorial: Analog, Mixed-Signal and RF Testing, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. 33, No. 3, pp. 281-282, DOI: 10.1007/s10836-017-5663-z, 2017
Malloug H., Barragan M., Mir S., Le Gall H., Harmonic cancellation strategies for on-chip sinusoidal signal generation using digital resources, International Mixed-Signal Testing Workshop (IMSTW'17), Thessaloniki, GREECE, 2017
Malloug H., Barragan M., Mir S., Basteres L., Le Gall H., Design of a sinusoidal signal generator with calibrated harmonic cancellation for mixed-signal BIST in a 28 nm FDSOI technology, European Test Symposium (ETS'17), Limassol, CYPRUS, 2017
Portolan M., Barragan M., Alhakim R., Mir S., Mixed-Signal BIST computation offloading using IEEE 1687, European Test Symposium (ETS'17), Limassol, CYPRUS, 2017
Renaud G., Margalef-Rovira M., Barragan M., Mir S., Analysis of an efficient on-chip servo-loop technique for reduced-code static linearity test of pipeline ADCs, VLSI Test Symposium (VTS'17), Las Vegas, UNITED STATES, DOI: 10.1109/VTS.2017.7928951, 2017
Annual activity report