Call for Participation

2nd IEEE International On-Line Testing Workshop

Hotel Helianthal, Biarritz - Saint-Jean-de-Luz, France July 8-10, 1996

The increased complexity of electronic systems has seen increasing reliability needs in various application domains as well as pressure for low cost products. There is a corresponding increased demand for cost-effective on-line test techniques. This workshop provides an informal forum to discuss all aspects of on-line testing. The Workshop is sponsored by the IEEE Computer Society Test Technology Technical Committee, co-organized by TTTC On-line Testing Technical Activity Committee, the European Group of the Test Technology Technical Committee (ETTTC).
The topics include (but are not limited to) the following ones:

* Concurrent checking
* Periodic testing in the field
* Field diagnosis
* Self-checking digital, analog and mixed-signal circuits
* Coding theory
* On-line and off-line BIST
* Synthesis of on-line testable circuits
* Radiation hardened/tolerant processes and design techniques
* Sensors/detectors for on-line monitoring of current, temperature and other reliability relevant parameters
* Fault-tolerant and fail-safe systems
* On-line testing in automotive, railway, avionics, industrial control and space applications

The program committee invites original presentations in these areas. To encourage and facilitate informal discussion mandates that participation be limited. Those interested in presenting recent results at the workshop submit three copies of an extended abstract, one to three pages long, or full length paper to the Program Chair. Please observe the following deadlines:

- submission deadline: March 18th, 1996
- notification of acceptance: April 12th, 1996

Submit proposals to:                  General Information:

Dhiraj K. Pradhan Michael Nicolaidis Department of Computer Science Reliable Int. Systems Group Texas A&M Univ., College Station TIMA 161 rue Ada 46 Av. Felix Viallet TX 77843-3112, USA 38031 Grenoble, France Tel:+1 409 862 2438 Tel: +33 4 76 57 46 19 Fax:+1 409 862 2758 Fax: +33 4 76 47 38 14

The International On-Line Testing Workshop is sponsored by the IEEE Computer Society Test Technology Technical Committee in cooperation with the European Test Technology Technical Committee (ETTTC). It is also sponsored by the TIMA - Techniques de l'Informatique et de la Microelectronique pour l'Architecture d'Ordinateurs.

A Special Issue of JETTA will be organized from contributions presented at the Workshop.

Organisation Committee

General Chair Program Chair M. Nicolaidis, TIMA - France D. Pradhan, Texas A&M U. - USA

Vice-General Chair Publications Chair Y. Zorian, AT&T Bell Labs - USA M. Chatterjee, Texas A&M U. - USA

Local Arrangements ETTTC Liaison C. Dufaza, LIRMM - France C. Landrault, LIRMM - France

Publicity R. Leveugle, CSI/INPG - France

Program Committee

J. A. Abraham, U. of Texas D. Levi, CEP SYSTEMS M. Abramovici, Lucent Technologies J. Y. LeGall, Alcatel Espace L. Alkalai, JPL/Caltech J.C. Lo, Rhode Island U. D. Avresky, Texas A&M U. J. Marshall, Loral Federal Systems E. Boehl, Robert Bosch GmbH P. Marchal, CSEM SA B. Bose, Oregon State U. C. Metra, U. Bologna S. Bracho, U. of Cantabria E.J. McCluskey, Stanford U. T. Calin, TIMA T. Nanya, Tokyo Inst. of Techn. K. T. Cheng, UCSB D. Nicolos, U. Patras R. David, LAG A. Orailoglu, U. CA, San Diego W. Debaney, Rome Lab. RL/ERDA A. Paschalis, NCSR Demokritos J.P. Hayes, U. Michigan P. Prinetto, Politecnico di Torino J. Figueras, U. P. de Catalunya S. M. Reddy, Iowa U. Ph. Forin, Matra Transport F. Simon, Alcatel Alsthom Rech. W.K. Fuchs, U. Illinois A.D. Singh, Auburn U. M. Giraud, Dassault Electronique E.S. Sogomonyan, Rus. A. of Sc. M. Goessel, Max-Plank Society V. Szekely, TU Budapest S. Gupta, USC R. Velazco, LGI/INPG B. Kaminska, Ecole Pol. Montreal T. Williams, IBM N. Kanopoulos, DCT C.W Wu, Nat. Tsing Hua U. K. Kuchukian, Armenian NAS H.J. Wunderlich , U. Stuttgart P.K. Lala, N. Carolina A&T State U.

About the location: Hotel Helianthal is located beside the beach, in the center of Saint-Jean-de-Luz, on the outskirts of Biarritz. Biarritz is a renowned tourist resort, famous for its history and rich in its landscape. Lying along the Altantic coast in south-west France, Biarritz offers the pleasures of sea sports under a salubrious climate.It also lies in the close proximity of the enchanting Pyrenees, which extend further south into Spain. Well connected by air and rail to the other major cities nearby, Biarritz makes an ideal venue for this conference.

2nd IEEE International On-Line Testing Workshop

IEEE COMPUTER SOCIETY - Test Technology Technical Committee