8th IEEE International On-Line Testing Workshop
Hotel Delos - Isle of Bendor, France
July 8-10, 2002

General Chair
M. Nicolaidis,
iRoC Technologies
M. Abramovici,
Agere Systems

Program Chairs
M. Sonza Reorda,
Politec. di Torino
C. Metra,
U. Bologna

Vice General Chair
Y. Zorian,
R. Leveugle,
TIMA Laboratory

Vice Program Chair
D. Nikolos,
U. Patras
J. Hayes,
U. Michigan

R. Velazco,
TIMA Laboratory

M. Violante,
Politec. di Torino

Local Chair
L. Anghel,
TIMA Laboratory

Financial Chair
A. Rambaud,
iRoC Technologies

Industrial Liaison
E. Dupont,
iRoC Technologies

ETTTC Liaison
C. Landrault,

Program Committee
J. Abraham,
U. Texas
E. Boehl,
Robert Bosch GmbH
C. Bolchini,
Politec. di Milano
A. Dandache,
U. Metz
J. Figueras,
U.P. de Catalunya
P. Girard,
D. Gizopoulos,
U. Piraeus
M. Goessel,
U. of Postdam
Th. Haniotakis,
U. Southern Illinois
A. Ivanov,
U. of Brit. Columbia
R. Iyer,
U. Illinois
D. Kagaris,
U. Southern Illinois
R. Kleihorst,
A. Krasniewski,
Warsaw U.T.
K. Kuchukian,
Armenian NAS
P.K. Lala,
U. of Arkansas
H. Levendel,
I. Levin,
U. Tel Aviv
J.C. Lo,
U. Rhode Island
S. Mitra,
Stanford U.
Y. Maidon,
U. Bordeaux
H. Manhaeve,
A. Orailoglu,
U. of Cal. San Diego
A. Paschalis,
Athens U.
S. Piestrak,
iRoC Technologies
D. Pradhan,
U. Bristol
M. Rebaudengo,
Politec. di Torino
K. Roy,
Purdue U.
J. Segura,
U. Illes Balears
E. Simeu,
TIMA Laboratory
J. Sosnowski,
Warsaw U.T.
G. Stamoulis,
U. Crete
B. Straube,
Fraunhofer IIS/EAS
C.E. Stroud,
U.N. Carolina
N.A. Touba,
U. Texas
S. Tragoudas,
U. Southern Illinois
Y. Tsiatouhas,
F. Vargas,
H.T. Vierhaus,
Brandenburg T.U.

Call For Participation

The increased complexity of electronic systems has seen increasing reliability needs in various application domains as well as pressure for low cost products. There is a corresponding increased demand for cost-effective on-line test techniques. These needs are increased dramatically in the near future, since very deep submicron and nanometer technologies impact adversely noise margins and make mandatory integrating on-line test in ICs. The workshop is also emphasizing on on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication.
The Workshop is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), co-organized by the TTTC On-line Testing TAC and the European Group of TTTC, in collaboration with Politecnico di Torino, TIMA, and IRoC Technologies (France).
The topics include (but are not limited to)
the following ones
On-line test in the contineous operation of large systems H. Levendel, Motorola
Field diagnosis, maintainability and reconfiguration M. Abramovici, Agere Systems
Reliability issues in nanometer technologies M. Nicolaidis, iRoC Technologies
G. Stamoulis, U. Crete
On-line testing of analog and mixed signal circuits J. Segura, U. Illes Balears
Self-checking circuits and coding theory M. Goessel, Potsdam U.
A. Paschalis, Athens U.
On-line and off-line BIST D. Gizopoulos, U. Piraeus
S. Tragoudas, U. Southern Illinois
Synthesis of on-line testable circuits R. Leveugle, TIMA Laboratory
Radiation effects R. Velazco, TIMA Laboratory
Fault-tolerant and fail-safe Systems A. Orailoglu, U.Cal. San Diego
On-line testing in automotive, railway, avionics and industrial control E. Boehl, Robert Bosch GmbH
S. Piestrak, iRoC Technologies
On-line power monitoring and control K. Roy, Purdue U.
Reliability evaluation M. Sonza Reorda, Politec. di Torino
On-line monitoring of current, temperature and other reliability indicators A. Ivanov, U. British Columbia
H. Manhaeve, QStar

Submissions: All submissions should have a title page with the name, address, phone number, fax number, and e-mail address of a contact author. Authors of accepted papers will have the option of having their papers included in a formal Proceedings to be published by the IEEE. The title page of each submission should state whether or not the authors want the paper to be considered for publication in the Workshop Proceedings. To be included in the Proceedings, a full-length paper must be submitted by the submission deadline. Authors not wishing their work published in the Proceedings may submit either a full-length paper or an extended abstract.

The best papers of the workshop will be invited to be re-submitted for a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA), published by Kluwer Academic Publishers.

  • Electronic submissions in PDF or Postscript (large Postscript files should be compressed and uuencoded) should be send to: ioltw-02.

  • For ftp submissions please contact M. Sonza Reorda.
  • Matteo Sonza Reorda
    Dipartimento di Automatica e Informatica
    Politecnico di Torino
    Corso Duca degli Abruzzi,24
    Torino, Italy
    Tel.: +39 011564 7055
    Fax: +39 011564 7099

Please observe the following deadlines:
Submission deadline: February 18, 2002
Notification of acceptance: March 23, 2002

General Information:
Miron Abramovici
Circuits and Systems Research Lab.
Agere Systems
600 Mountain Ave Rm. 2C-225
Murray Hill, NJ 07974-0636
Tel.: +1 908 582 3933
Fax: +1 908 582 4092
                Michael Nicolaidis
iRoC Technologies
World Trade Center
BP 1510 38025 Grenoble Cedex
Tel.: +33 4 3812 0763
Fax: +33 4 3812 9615

About the location: The Workshop will be held in the beautiful island of Bendor in the Delos Hotel. The Island is a very small island (7ha.) located in front of Bandol French Riviera coast close to Marseille and Toulon. This island has kept all the charming attractive sides of small Provencal houses and luxuriant gardens where life is worth living (there are no cars).

Please note that the IEEE Memory Technology, Design and Testing (MTDT 2002) is organised back-to-back with IOLTW 2002 on July 10 to 12, 2002 at Isle of Bendor.

IEEE Computer Society
Test Technology Technical Council