23rd IEEE International Symposium on On-Line Testing and Robust System Design
Hotel Makedonia Palace, Thessaloniki, Greece, July 3-5, 2017


Committees
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IOLTS 2017 Organizing Committee

General Chairs
MichaelNicolaidisTIMA Lab
Antonis PaschalisU Athens
Program Co-Chairs
DimitrisGizopoulosU Athens
DanAlexandrescuiRoC
Vice-General Chairs
YervantZorianSynopsys
Adrian EvansiRoC
Vice-Program Chairs
Stefano di CarloPolit. Di Torino
Antonio  Rubio UPC
Publications Chairs
Mihalis ManiatakosNYUAD
Panagiota PapavramidouTIMA Lab
Publicity Chairs
George TheodrouU Athens
Finance Chairs
Lorena AnglelTIMA Lab
Raoul VelazcoTIMA Lab
Registration
Emmanuel SimeuTIMA Lab
Nacer-Eddine ZergainohTIMA Lab
Audio Visual and Local Organization
Manolis KaliorakisU Athens
Athanasios ChatzidimitriouU Athens
George PapadimitriouU Athens
Local Arrangements Chairs
Spiros Nikolaidis U Thessaloniki
Alkis Hatzopoulos U Thessaloniki
Secretary
Anne-Laure ItieTIMA Lab
ETTTC Liaison
Giorgio Di NataleLIRMM
Latin America Liaison
Ricardo Reis UFRGS
China Liaison
Xiaowei Li Chinese Academy. of Science
India Liaison
Rubin Parekhji Texas Instruments
Japan Liaison
Eishi Ibe Exapalette
US Liaison
Adit Singh Auburn U.

 

IOLTS 2017 Program Committee

Magdy Abadir
Jaume Abella BSC
Jacob Abraham U Texas at Austin
Muhesh Agrawal Intel
Rob Aitken ARM
Dan Alexandrescu iRoC
Bernd Becker U Freiburg
Mounir Benabdenbi TIMA Laboratory
Ramon Canal UPC
Luigi Carro UFRGS
Abhijit Chatterjee Georgia Tech.
Shidhartha Das ARM
Stefano Di Carlo Politec. Di Torino
Giorgio Di Natale LIRMM
Adrian Evans iRoC
Georg Georgakos Infineon
Patrick Girard LIRMM
Dimitris Gizopoulos U Athens
Abhilash Goyal Oracle
Arnaud Grasset Thales
Sudhanva Gurumurthy AMD/U Virginia
Siva Hari NVIDIA
Sybille Hellebrand U Paderborn
Yu Hu Chinese Academy of Science
Shi-Yu Huang National Tsing-Hua U
Ravishankar Iyer U Illinois
Maksim Jenihhin Tallinn U Technology
Hailong Jiao Peking University
George Karakonstantis QUB
Nektarios Kranitis U Athens
Regis Leveugle TIMA Laboratory
Huawei Li Chinese Academy of Science
Xiaowei Li Chinese Academy of Science
Celia Lopez Ongil University Carlos III de Madrid
Amit Majumdar Xilinx
Yiorgos Makris UT Dallas
Mihalis Maniatakos NYUAD
Nele Mentens Katholieke Universiteit Leuven, ESAT
Cecilia Metra University of Bologna
Maria Michael U Cuprus
Antonio Miele Politec. Di Milano
Ronny Morad IBM Research
Helia Naeimi Intel Labs
Michael Nicolaidis TIMA Laboratory
Dimitris Nikolos U Patras
Marco Ottavi U Roma
Sujan Pandey NXP
Christos Papachristou CWRU
Panagiota Papavramidou TIMA Laboratory
Rubin Parekhji TI
Antonis Paschalis U Athens
Steffen Paul U Bremen
Stanislaw Piestrak U Lorraine
Ilia Polian U Passau
Paolo Prinetto Politec. di Torino
Mihalis Psarakis U Piraeus
Paolo Rech UFRGS
Pedro Reviriego Universidad Antonio de Nebrija
Rance Rodrigues NVIDIA
Kaushik Roy Purdue U
Antonio Rubio UPC
Chiara Sandionigi CEA-LIST
Karu Sankaralingam U Wisconsin-Madison
Norbert Seifert Intel
Jorge Semiao INESC-ID / Univ. Algarve
Emmanuel Simeu TIMA Laboratory
Ozgur Sinanoglu NYUAD
Virendra Singh IISC
Matteo Sonza Reorda Politecnico di Torino
Vilas Sridharan AMD
Zoran Stamenkovic IHP
Haralampos Stratigopoulos LIP6
Mehdi Tahoori Karlsruhe Institute of Technology
Spyros Tragoudas Southern Illinois U
Yiorgos Tsiatouhas U Ioannina
Taiki Uemura Samsung
Gaurang Upasani Intel
Fabian Vargas PUCRS
Raoul Velazco TIMA Laboratory
Xavier Vera Intel
Massimo Violante Politec. di Torino
Li-C. Wang UC Santa Barbara
Hans Joachim Wunderlich U Stuttgart
Yervant Zorian Synopsys

 

IOLTS 2017 Topic Chairs

Low-Power Versus Reliability
Patrick Girard LIRMM
Anand Raghunathan Purdue U.
Memory Robustness
Gurgen Harutyunyan Synopsys
Aging and Variability
Florian Cacho STM
Robustness in Automotive Electronics
Paolo Bernardi Polit. Di Torino

 

Steering Committee

Jacob Abraham U. Texas at Austin
Dan Alexandrescu iRoC
Abhijit Chaterjee GeorgiaTech
Dimitris Gizopoulos U. Athens
Cecilia Metra U. Bologna
Michael Nicolaidis TIMA
Antonis Paschalis U. Athens
Kaushik Roy Purdue U.
Matteo Sonza Reorda Polit. di Torino 
Yervant Zorian Synopsys



IEEE Council on Electronics Design Automation Test Technology Technical Council
University of Athens TIMA Laboratory Grenoble INP