15th IEEE International On-Line Testing Symposium Sesimbra-Lisbon, Portugal,
June 24-26, 2009.
General Information
  IOLTS will be hold back to back with DSN
This year IOLTS will be held back to back with DSN, in geographically close sites in Lisbon area. DSN is scheduled on June 29 to July 2, in the Estoril area, at about 30 Km west of Lisbon. On the "Workshops Day" of DSN, June 29, there will also be a workshop, WDSN, on IOLTS related topics.
IOLTS and DSN cover technically close though complementary domains. This provides a unique opportunity to interesting participants attending both events and benefiting from a comprehensive coverage of all topics related to dependable systems, spanning from technology level, gate-level and RTL level issues, analysis techniques and architectures up to system level and software level.

Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wearout and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips. The Symposium is sponsored by the IEEE Computer Society, Test Technology Technical Council and organized by TIMA Laboratory, INESC-ID, and University of Piraeus.

  The topics include (but are not limited to) the following ones:
◊  Reliability issues in nanometer technologies
◊  Design for reliability
◊  Design for variability
◊  Dependable systems design
◊  Dependability aware power and performance management
◊  Field diagnosis, maintainability and reconfiguration
◊  On-line testing of analog and mixed signal circuits
◊  On-line testing in the continuous operation of large systems
◊  On-line testing in automotive, railway, avionics industry
◊  On-line testing in industrial control
◊  Fault-based attacks and counter measures
◊  Self-checking circuits and coding theory
◊  On-line and off-line BIST
◊  Synthesis of on-line testable circuits
◊  Radiation effects
◊  Fault-tolerant and fail-safe systems
◊  On-line power monitoring and control
◊  On-line current, temperature, monitoring
◊  Dependability evaluation

©2009 Laboratoire TIMA.
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