Issues related to on-line testing are increasingly important in modern electronic systems.
In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products.
There is a corresponding increasing demand for cost-effective on-line testing techniques.
These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins and process parameters variations and make integrating on-line testing and fault tolerance mandatory in many modern ICs.
The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas.
The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips.
The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council and organized by TIMA Laboratory, University of Athens and University of Piraeus.
The topics include the following ones:
• Reliability issues in nanometer technologies
• On-line testing of analog and mixed signal circuits
• On-line testing in the continuous operation of large systems
• On-line testing in automotive, railway, avionics, industry
• On-line current, temperature, etc, monitoring
• On-line and off-line built-in self-test
• Self-checking circuits and coding theory
• Field diagnosis, maintainability and reconfiguration
• Dependable systems design
• Dependability evaluation
• Synthesis of on-line testable circuits
• Fault-tolerant and fail-safe systems
• On-line power monitoring and control
• Radiation effects
• Secure circuit design
• Fault-based attacks and counter measures